Inventor · disambiguated record
Der-Tsyr Fan
Also filed as: FAN DER-TSYR
30 granted patents·10 pending applications·1,102 citations·filing 1996–2024
97Inventor score
Files withIOTMEMORY TECH INC10MOSEL VITELIC INC9SILICON STORAGE TECH INC6XINNOVA TECH LTD5ACTRANS SYSTEM INC USA4
Top patents by PatentIndex Score
40 records- 0198US6747310B2Flash memory cells with separated self-aligned select and erase gates, and process of fabricationACTRANS SYSTEM INC·Filed 2002·Granted Jun 8, 2004·564 cites·31 claims
- 0296US6894339B2Flash memory with trench select gate and fabrication processACTRANS SYSTEM INC USA·Filed 2003·Granted May 17, 2005·156 cites·39 claims
- 0395US7037787B2Flash memory with trench select gate and fabrication processACTRANS SYSTEM INC USA·Filed 2005·Granted May 2, 2006·59 cites·17 claims
- 0494US7718488B2Process of fabricating flash memory with enhanced program and erase couplingSILICON STORAGE TECH INC·Filed 2006·Granted May 18, 2010·35 cites·21 claims
- 0592US9673338B2Non-volatile memory unit and method for manufacturing the sameXINNOVA TECH LTD·Filed 2016·Granted Jun 6, 2017·10 cites·22 claims
- 0690US7598561B2NOR flash memorySILICON STORAGE TECHNOLGY INC·Filed 2006·Granted Oct 6, 2009·31 cites·17 claims
- 0790US6992929B2Self-aligned split-gate NAND flash memory and fabrication processACTRANS SYSTEM INC USA·Filed 2004·Granted Jan 31, 2006·59 cites·30 claims
- 0888US7046552B2Flash memory with enhanced program and erase coupling and process of fabricating the sameACTRANS SYSTEM INC USA·Filed 2004·Granted May 16, 2006·45 cites·21 claims
- 0988US6885586B2Self-aligned split-gate NAND flash memory and fabrication processACTRANS SYSTEM INC·Filed 2002·Granted Apr 26, 2005·40 cites·40 claims
- 1087US7668013B2Method for erasing a flash memory cell or an array of such cells having improved erase coupling ratioSILICON STORAGE TECH INC·Filed 2008·Granted Feb 23, 2010·17 cites·8 claims
- 1181US10644011B1Non-volatile memoryIOTMEMORY TECH INC·Filed 2019·Granted May 5, 2020·5 cites·15 claims
- 1277US7217621B2Self-aligned split-gate NAND flash memory and fabrication processSILICON STORAGE TECH INC·Filed 2005·Granted May 15, 2007·10 cites·29 claims
- 1374US2025120077A1Non-volatile memory deviceIOTMEMORY TECH INC·Filed 2024·Application pending·0 cites
- 1469US9502513B2Non-volatile memory device and manufacture of the sameXINNOVA TECH LTD·Filed 2016·Granted Nov 22, 2016·2 cites·20 claims
- 1568US9502582B2Non-volatile memory unit and method for manufacturing the sameXINNOVA TECH LTD·Filed 2016·Granted Nov 22, 2016·1 cites·18 claims
- 1663US12225723B2Non-volatile memory deviceIOTMEMORY TECH INC·Filed 2022·Granted Feb 11, 2025·0 cites·20 claims
- 1760US9640403B2Low electric field source erasable non-volatile memory and methods for producing sameXINNOVA TECH LTD·Filed 2015·Granted May 2, 2017·1 cites·15 claims
- 1856US2025133736A1Non-volatile memory deviceIOTMEMORY TECH INC·Filed 2024·Application pending·0 cites
- 1954US7974136B2Method for erasing a flash memory cell or an array of such cells having improved erase coupling ratioSILICON STORAGE TECH INC·Filed 2009·Granted Jul 5, 2011·2 cites·8 claims
- 2054US2025133775A1Non-volatile memory deviceIOTMEMORY TECH INC·Filed 2024·Application pending·0 cites
- 2152US9647143B2Non-volatile memory unit and method for manufacturing the sameXINNOVA TECH LTD·Filed 2016·Granted May 9, 2017·0 cites·6 claims
- 2252US7501321B2NAND flash memory with densely packed memory gates and fabrication processSILICON STORAGE TECH INC·Filed 2006·Granted Mar 10, 2009·2 cites·9 claims
- 2349US5837578AProcess of manufacturing a trenched stack-capacitorMOSEL VITELIC INC·Filed 1997·Granted Nov 17, 1998·12 cites·33 claims
- 2449US2024162316A1Non-volatile memory device and method for manufacturing the sameIOTMEMORY TECH INC·Filed 2023·Application pending·0 cites
- 2548US2024162317A1Non-volatile memory device and method for manufacturing the sameIOTMEMORY TECH INC·Filed 2023·Application pending·0 cites
- 2648US2024304692A1Non-volatile memory device and method for manufacturing the sameIOTMEMORY TECH INC·Filed 2023·Application pending·0 cites
- 2747US12279422B2Method of manufacturing non-volatile memory deviceIOTMEMORY TECH INC·Filed 2022·Granted Apr 15, 2025·0 cites·20 claims
- 2846US2024274682A1Non-volatile memory deviceIOTMEMORY TECH INC·Filed 2023·Application pending·0 cites
- 2945US7646641B2NAND flash memory with nitride charge storage gates and fabrication processSILICON STORAGE TECH INC·Filed 2004·Granted Jan 12, 2010·4 cites·15 claims
- 3042US6654291B2Electrically erasable programmable read-only memory and method of erasing select memory cellsMOSEL VITELIC INC·Filed 2002·Granted Nov 25, 2003·5 cites·21 claims
- 3142US5926715AMethod of forming lightly-doped drain by automatic PSG dopingMOSEL VITELIC INC·Filed 1997·Granted Jul 20, 1999·13 cites·18 claims
- 3240US5747378AMethod of damage free doping for forming a dram memory cellMOSEL VITELIC INC·Filed 1997·Granted May 5, 1998·9 cites·19 claims
- 3339US6110801AMethod of fabricating trench isolation for IC manufactureMOSEL VITELIC INC·Filed 1998·Granted Aug 29, 2000·9 cites·16 claims
- 3435US6380072B2Metallizing process of semiconductor industryMOSEL VITELIC INC·Filed 2000·Granted Apr 30, 2002·0 cites·18 claims
- 3535US6365064B1Method for evenly immersing a wafer in a solutionMOSEL VITELIC INC·Filed 1998·Granted Apr 2, 2002·6 cites·5 claims
- 3634US2006017085A1NAND flash memory with densely packed memory gates and fabrication processTUNTASOOD PRATEEP·Filed 2004·Application pending·0 cites
- 3733US5882984AMethod for increasing the refresh time of the DRAMMOSEL VITELIC INC·Filed 1996·Granted Mar 16, 1999·4 cites·19 claims
- 3832US2005145923A1NAND flash memory with enhanced program and erase performance, and fabrication processFiled 2004·Application pending·0 cites
- 3931US2015214315A1Non-Volatile Memory and Methods for Producing SameXINNOVA TECHNOLOGY LTD·Filed 2015·Application pending·0 cites
- 4027US6245608B1Ion implantation process for forming contact regions in semiconductor materialsMOSEL VITELIC INC·Filed 1999·Granted Jun 12, 2001·1 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →