Inventor · disambiguated record
Deborah M. Massey
Also filed as: MASSEY DEBORAH M
13 granted patents·1 pending application·62 citations·filing 2003–2020
89Inventor score
Top patents by PatentIndex Score
14 records- 0188US10989754B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Apr 27, 2021·2 cites·13 claims
- 0288US10564214B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Feb 18, 2020·2 cites·12 claims
- 0387US9739824B2Optimization of integrated circuit reliabilityIBM·Filed 2016·Granted Aug 22, 2017·2 cites·10 claims
- 0486US7096450B2Enhancement of performance of a conductive wire in a multilayered substrateIBM·Filed 2003·Granted Aug 22, 2006·41 cites·18 claims
- 0573US9851397B2Electromigration testing of interconnect analogues having bottom-connected sensory pinsGLOBALFOUNDRIES INC·Filed 2015·Granted Dec 26, 2017·2 cites·18 claims
- 0672US10996259B2Optimization of integrated circuit reliabilityIBM·Filed 2020·Granted May 4, 2021·0 cites·17 claims
- 0772US8217671B2Parallel array architecture for constant current electro-migration stress testingAGARWAL KANAK B·Filed 2009·Granted Jul 10, 2012·6 cites·19 claims
- 0871US11054459B2Optimization of integrated circuit reliabilityIBM·Filed 2019·Granted Jul 6, 2021·0 cites·15 claims
- 0967US8592947B2Thermally controlled refractory metal resistorLUKAITIS JOSEPH M·Filed 2010·Granted Nov 26, 2013·2 cites·16 claims
- 1063US7512506B2IC chip stress testingIBM·Filed 2007·Granted Mar 31, 2009·5 cites·14 claims
- 1156US9395403B2Optimization of integrated circuit reliabilityIBM·Filed 2013·Granted Jul 19, 2016·0 cites·20 claims
- 1254US8765568B2Method of fabricating thermally controlled refractory metal resistorIBM·Filed 2013·Granted Jul 1, 2014·0 cites·20 claims
- 1347US7511378B2Enhancement of performance of a conductive wire in a multilayered substrateIBM·Filed 2006·Granted Mar 31, 2009·0 cites·3 claims
- 1436US2012259575A1Integrated circuit chip incorporating a test circuit that allows for on-chip stress testing in order to model or monitor device performance degradationGRAAS CAROLE D·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →