Inventor · disambiguated record
Dipankar Pramanik
Also filed as: PRAMANIK DIPANKAR
127 granted patents·29 pending applications·1,631 citations·filing 1990–2017
99Inventor score
Top patents by PatentIndex Score
156 records- 0197US7895548B2Filler cells for design optimization in a place-and-route systemSYNOPSYS INC·Filed 2007·Granted Feb 22, 2011·128 cites·34 claims
- 0296US9076523B2Methods of manufacturing embedded bipolar switching resistive memoryINTERMOLECULAR INC·Filed 2012·Granted Jul 7, 2015·25 cites·14 claims
- 0396US8466005B2Method for forming metal oxides and silicides in a memory devicePRAMANIK DIPANKAR·Filed 2011·Granted Jun 18, 2013·23 cites·20 claims
- 0496US7484198B2Managing integrated circuit stress using dummy diffusion regionsSYNOPSYS INC·Filed 2006·Granted Jan 27, 2009·48 cites·8 claims
- 0596US6928635B2Selectively applying resolution enhancement techniques to improve performance and manufacturing cost of integrated circuitsSYNOPSYS INC·Filed 2002·Granted Aug 9, 2005·236 cites·18 claims
- 0695US8288297B1Atomic layer deposition of metal oxide materials for memory applicationsWANG YUN·Filed 2011·Granted Oct 16, 2012·23 cites·20 claims
- 0795US7542891B2Method of correlating silicon stress to device instance parameters for circuit simulationSYNOPSYS INC·Filed 2006·Granted Jun 2, 2009·40 cites·25 claims
- 0893US9012260B2Controlling ReRam forming voltage with dopingINTERMOLECULAR INC·Filed 2014·Granted Apr 21, 2015·8 cites·19 claims
- 0993US6931617B2Mask cost driven logic optimization and synthesisSYNOPSYS INC·Filed 2003·Granted Aug 16, 2005·227 cites·44 claims
- 1092US9177916B1Amorphous silicon doped with fluorine for selectors of resistive random access memory cellsINTERMOLECULAR INC·Filed 2014·Granted Nov 3, 2015·14 cites·10 claims
- 1192US8735217B2Multifunctional electrodeINTERMOLECULAR INC·Filed 2013·Granted May 27, 2014·4 cites·20 claims
- 1291US9246092B1Tunneling barrier creation in MSM stack as a selector device for non-volatile memory applicationINTERMOLECULAR INC·Filed 2014·Granted Jan 26, 2016·8 cites·14 claims
- 1391US9025360B2Method for improving data retention of ReRAM chips operating at low operating temperaturesINTERMOLECULAR INC·Filed 2013·Granted May 5, 2015·6 cites·18 claims
- 1491US7897479B2Managing integrated circuit stress using dummy diffusion regionsSYNOPSYS INC·Filed 2008·Granted Mar 1, 2011·18 cites·14 claims
- 1591US7767515B2Managing integrated circuit stress using stress adjustment trenchesSYNOPSYS INC·Filed 2006·Granted Aug 3, 2010·18 cites·19 claims
- 1691US7600207B2Stress-managed revision of integrated circuit layoutsSYNOPSYS INC·Filed 2006·Granted Oct 6, 2009·24 cites·33 claims
- 1790US8817524B2Resistive random access memory cells having metal alloy current limiting layersINTERMOLECULAR INC·Filed 2012·Granted Aug 26, 2014·11 cites·20 claims
- 1889US8981332B2Nonvolatile resistive memory element with an oxygen-gettering layerINTERMOLECULAR INC·Filed 2013·Granted Mar 17, 2015·10 cites·10 claims
- 1989US8907313B2Controlling ReRam forming voltage with dopingINTERMOLECULAR INC·Filed 2012·Granted Dec 9, 2014·6 cites·9 claims
- 2088US9292627B2System and method for modifying a data set of a photomaskCADENCE DESIGN SYSTEMS INC·Filed 2013·Granted Mar 22, 2016·5 cites·24 claims
- 2188US8407634B1Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2005·Granted Mar 26, 2013·10 cites·26 claims
- 2288US5493146AAnti-fuse structure for reducing contamination of the anti-fuse materialVLSI TECHNOLOGY INC·Filed 1994·Granted Feb 20, 1996·77 cites·22 claims
- 2387US8086990B2Method of correlating silicon stress to device instance parameters for circuit simulationLIN XI-WEI·Filed 2009·Granted Dec 27, 2011·16 cites·14 claims
- 2486US8572517B2System and method for modifying a data set of a photomaskPRAMANIK DIPANKAR·Filed 2008·Granted Oct 29, 2013·9 cites·11 claims
- 2585US9082927B1Catalytic growth of Josephson junction tunnel barrierINTERMOLECULAR INC·Filed 2013·Granted Jul 14, 2015·5 cites·16 claims
- 2685US8466446B2Atomic layer deposition of metal oxide materials for memory applicationsWANG YUN·Filed 2012·Granted Jun 18, 2013·5 cites·20 claims
- 2784US8906736B1Multifunctional electrodeINTERMOLECULAR INC·Filed 2014·Granted Dec 9, 2014·1 cites·20 claims
- 2884US8803124B2Creating an embedded reram memory from a high-K metal gate transistor structurePRAMANIK DIPANKAR·Filed 2012·Granted Aug 12, 2014·5 cites·21 claims
- 2984US8504969B2Filler cells for design optimization in a place-and-route systemLIN XI-WEI·Filed 2010·Granted Aug 6, 2013·8 cites·12 claims
- 3083US9884123B2Ligand-targeted molecules and methods thereofINVICTUS ONCOLOGY PVT LTD·Filed 2013·Granted Feb 6, 2018·4 cites·11 claims
- 3183US9240236B1Switching conditions for resistive random access memory cellsINTERMOLECULAR INC·Filed 2014·Granted Jan 19, 2016·8 cites·20 claims
- 3282US9054307B2Resistive random access memory cells having metal alloy current limiting layersINTERMOLECULAR INC·Filed 2014·Granted Jun 9, 2015·6 cites·20 claims
- 3382US8907314B2MoOx-based resistance switching materialsINTERMOLECULAR INC·Filed 2012·Granted Dec 9, 2014·4 cites·14 claims
- 3481US8069430B2Stress-managed revision of integrated circuit layoutsMOROZ VICTOR·Filed 2009·Granted Nov 29, 2011·8 cites·7 claims
- 3580US8921181B2Flourine-stabilized interfaceINTERMOLECULAR INC·Filed 2012·Granted Dec 30, 2014·5 cites·20 claims
- 3680US8779407B2Multifunctional electrodePHAM HIEU·Filed 2012·Granted Jul 15, 2014·1 cites·19 claims
- 3779US9465897B2Analysis of stress impact on transistor performanceSYNOPSYS INC·Filed 2013·Granted Oct 11, 2016·2 cites·35 claims
- 3879US8835310B2Two step deposition of molybdenum dioxide electrode for high quality dielectric stacksINTERMOLECULAR INC·Filed 2012·Granted Sep 16, 2014·4 cites·12 claims
- 3979US8686512B2Elevation of transistor channels to reduce impact of shallow trench isolation on transistor performanceMOROZ VICTOR·Filed 2011·Granted Apr 1, 2014·4 cites·7 claims
- 4079US8661398B1Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2013·Granted Feb 25, 2014·2 cites·21 claims
- 4179US8615728B2Analysis of stress impact on transistor performanceMOROZ VICTOR·Filed 2009·Granted Dec 24, 2013·4 cites·24 claims
- 4278US8995166B2Multi-level memory array having resistive elements for multi-bit data storageINTERMOLECULAR INC·Filed 2012·Granted Mar 31, 2015·5 cites·18 claims
- 4378US5834356AMethod of making high resistive structures in salicided process semiconductor devicesVLSI TECHNOLOGY INC·Filed 1997·Granted Nov 10, 1998·42 cites·21 claims
- 4477US8883655B2Atomic layer deposition of metal oxide materials for memory applicationsINTERMOLECULAR INC·Filed 2013·Granted Nov 11, 2014·2 cites·20 claims
- 4577US8878152B2Nonvolatile resistive memory element with an integrated oxygen isolation structureWANG YUN·Filed 2012·Granted Nov 4, 2014·4 cites·13 claims
- 4677US8546275B2Atomic layer deposition of hafnium and zirconium oxides for memory applicationsWANG YUN·Filed 2011·Granted Oct 1, 2013·3 cites·20 claims
- 4776US8778811B2Low temperature migration enhanced Si-Ge epitaxy with plasma assisted surface activationKRAUS PHILIP A·Filed 2011·Granted Jul 15, 2014·3 cites·19 claims
- 4876US5522957AMethod for leak detection in etching chambersVLSI TECHNOLOGY INC·Filed 1993·Granted Jun 4, 1996·28 cites·7 claims
- 4975US9222170B2Deposition of rutile films with very high dielectric constantINTERMOLECULAR INC·Filed 2012·Granted Dec 29, 2015·3 cites·18 claims
- 5075US7584438B2Method for rapid estimation of layout-dependent threshold voltage variation in a MOSFET arraySYNOPSYS INC·Filed 2007·Granted Sep 1, 2009·5 cites·6 claims
Showing the top 50 of 156 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Dipankar Pramanik files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →