Inventor · disambiguated record
Dieter Rathei
Also filed as: RATHEI DIETER
8 granted patents·1 pending application·83 citations·filing 1999–2006
86Inventor score
Top patents by PatentIndex Score
9 records- 0172US6717431B2Method for semiconductor yield loss calculationINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Apr 6, 2004·20 cites·20 claims
- 0262US7587292B2Method of monitoring a semiconductor manufacturing trendRATHEI DIETER·Filed 2006·Granted Sep 8, 2009·4 cites·20 claims
- 0362US7524683B2Method of monitoring a semiconductor manufacturing trendRATHEI DIETER·Filed 2006·Granted Apr 28, 2009·2 cites·20 claims
- 0461US6963813B1Method and apparatus for fast automated failure classification for semiconductor wafersRATHEI DIETER·Filed 2000·Granted Nov 8, 2005·9 cites·15 claims
- 0561US6553521B1Method for efficient analysis semiconductor failuresINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Apr 22, 2003·15 cites·17 claims
- 0660US7496478B2Method of monitoring a semiconductor manufacturing trendRATHEI DIETER·Filed 2006·Granted Feb 24, 2009·3 cites·25 claims
- 0760US6367040B1System and method for determining yield impact for semiconductor devicesSIEMENS AG·Filed 1999·Granted Apr 2, 2002·27 cites·18 claims
- 0837US7003432B2Method of and system for analyzing cells of a memory deviceINFINEON TECHNOLOGIES RICHMOND·Filed 2003·Granted Feb 21, 2006·3 cites·19 claims
- 0935US2007016321A1Method for screening risk quality semiconductor productsRATHEI DIETER·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Dieter Rathei files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →