Inventor · disambiguated record
Doug K. Masnaghetti
Also filed as: MASNAGHETTI DOUG K · MASNAGHETTI DOUG KEITH
9 granted patents·17 citations·filing 2004–2020
81Inventor score
Top patents by PatentIndex Score
9 records- 0188US10643819B2Method and system for charged particle microscopy with improved image beam stabilization and interrogationKLA TENCOR CORP·Filed 2016·Granted May 5, 2020·6 cites·28 claims
- 0286US10192716B2Multi-beam dark field imagingKLA TENCOR CORP·Filed 2016·Granted Jan 29, 2019·4 cites·21 claims
- 0385US10325753B2Method and system for focus adjustment of a multi-beam scanning electron microscopy systemKLA TENCOR CORP·Filed 2016·Granted Jun 18, 2019·4 cites·14 claims
- 0469US10460905B2Backscattered electrons (BSE) imaging using multi-beam toolsKLA TENCOR CORP·Filed 2016·Granted Oct 29, 2019·1 cites·22 claims
- 0568US10366862B2Method and system for noise mitigation in a multi-beam scanning electron microscopy systemKLA TENCOR CORP·Filed 2016·Granted Jul 30, 2019·1 cites·9 claims
- 0657US11120969B2Method and system for charged particle microscopy with improved image beam stabilization and interrogationKLA TENCOR CORP·Filed 2020·Granted Sep 14, 2021·0 cites·18 claims
- 0754US7612348B1Transverse magnetic field voltage isolatorKLA TECHNOLOGIES CORP·Filed 2008·Granted Nov 3, 2009·0 cites·13 claims
- 0848US7394339B1Transverse magnetic field voltage isolatorKLA TENCOR TECH CORP·Filed 2004·Granted Jul 1, 2008·1 cites·21 claims
- 0945US10861671B2Method and system for focus adjustment of a multi-beam scanning electron microscopy systemKLA TENCOR CORP·Filed 2019·Granted Dec 8, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →