Inventor · disambiguated record
Donald P. Richmond, Ii
Also filed as: RICHMOND DONALD P · RICHMOND II DONALD P · RICHMOND II DONALD PAUL · RICHMOND II II DONALD P
54 granted patents·7 pending applications·987 citations·filing 1994–2025
99Inventor score
Top patents by PatentIndex Score
61 records- 0198US11255903B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2020·Granted Feb 22, 2022·12 cites·11 claims
- 0298US6340895B1Wafer-level burn-in and test cartridgeAEHR TEST SYSTEMS INC·Filed 1999·Granted Jan 22, 2002·211 cites·44 claims
- 0397US9316683B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2015·Granted Apr 19, 2016·19 cites·10 claims
- 0497US8506335B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Aug 13, 2013·31 cites·6 claims
- 0597US8228085B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2010·Granted Jul 24, 2012·26 cites·22 claims
- 0696US11448695B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2020·Granted Sep 20, 2022·3 cites·35 claims
- 0796US9250291B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2012·Granted Feb 2, 2016·19 cites·22 claims
- 0896US8628336B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Jan 14, 2014·26 cites·11 claims
- 0996US7762822B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2006·Granted Jul 27, 2010·29 cites·37 claims
- 1095US7800382B2System for testing an integrated circuit of a device and its method of useAEHR Test Ststems·Filed 2007·Granted Sep 21, 2010·40 cites·26 claims
- 1194US8388357B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2012·Granted Mar 5, 2013·12 cites·58 claims
- 1294US8118618B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2010·Granted Feb 21, 2012·13 cites·59 claims
- 1394US7667475B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2008·Granted Feb 23, 2010·16 cites·87 claims
- 1493US7969175B2Separate test electronics and blower modules in an apparatus for testing an integrated circuitAEHR TEST SYSTEMS·Filed 2009·Granted Jun 28, 2011·27 cites·81 claims
- 1593US6580283B1Wafer level burn-in and test methodsAEHR TEST SYSTEMS·Filed 1999·Granted Jun 17, 2003·109 cites·35 claims
- 1692US2025085337A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 1792US2025085338A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 1891US6853209B1Contactor assembly for testing electrical circuitsAEHR TEST SYSTEMS·Filed 2002·Granted Feb 8, 2005·42 cites·14 claims
- 1991US2024393387A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2091US2024402243A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2191US2024393388A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2291US2024410938A1System for testing an integrated circuit of a device and itsmethod of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2390US6867608B2Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test componentAEHR TEST SYSTEMS·Filed 2002·Granted Mar 15, 2005·32 cites·13 claims
- 2489US12163999B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2023·Granted Dec 10, 2024·0 cites·22 claims
- 2584US7088117B2Wafer burn-in and test employing detachable cartridgeAEHR TEST SYSTEM·Filed 2003·Granted Aug 8, 2006·26 cites·26 claims
- 2683US12326472B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2022·Granted Jun 10, 2025·0 cites·12 claims
- 2783US9151797B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2014·Granted Oct 6, 2015·2 cites·6 claims
- 2882US8747123B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2013·Granted Jun 10, 2014·2 cites·5 claims
- 2981US11860221B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2022·Granted Jan 2, 2024·0 cites·12 claims
- 3079US9291668B2Electronics tester with a valve integrally formed in a component of a portable packAEHR TEST SYSTEMS·Filed 2015·Granted Mar 22, 2016·1 cites·29 claims
- 3177US5557149ASemiconductor fabrication with contact processing for wrap-around flange interfaceCHIPSCALE INC·Filed 1995·Granted Sep 17, 1996·48 cites·22 claims
- 3276US6101419AModular control system for manufacturing facilityLAM RES CORP·Filed 1998·Granted Aug 8, 2000·37 cites·13 claims
- 3375US10976362B2Electronics tester with power saving stateAEHR TEST SYSTEMS·Filed 2020·Granted Apr 13, 2021·0 cites·11 claims
- 3475US7511521B2Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test componentAEHR TEST SYSTEMS·Filed 2008·Granted Mar 31, 2009·5 cites·7 claims
- 3572US10718808B2Electronics tester with current amplificationAEHR TEST SYSTEMS·Filed 2018·Granted Jul 21, 2020·0 cites·9 claims
- 3672US6556032B2Wafer-burn-in and test employing detachable cartridgeAEHR TEST SYSTEMS·Filed 2001·Granted Apr 29, 2003·11 cites·25 claims
- 3772US6413113B2Kinematic couplingAEHR TEST SYSTEMS·Filed 1999·Granted Jul 2, 2002·33 cites·29 claims
- 3871US6562636B1Wafer level burn-in and electrical test system and methodAEHR TEST SYSTEMS·Filed 1999·Granted May 13, 2003·26 cites·7 claims
- 3971US5656547AMethod for making a leadless surface mounted device with wrap-around flange interface contactsCHIPSCALE INC·Filed 1994·Granted Aug 12, 1997·40 cites·16 claims
- 4070US8986048B2Integrated feedthrough moduleHENDRICKSON DAVID S·Filed 2011·Granted Mar 24, 2015·3 cites·9 claims
- 4169US10852347B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2018·Granted Dec 1, 2020·0 cites·14 claims
- 4269US10151793B2Electronics tester with double-spiral thermal control passage in a thermal chuckAEHR TEST SYSTEMS·Filed 2017·Granted Dec 11, 2018·0 cites·76 claims
- 4369US6682945B2Wafer level burn-in and electrical test system and methodAEHR TEST SYSTEMS·Filed 2001·Granted Jan 27, 2004·10 cites·21 claims
- 4469US5904496AWafer fabrication of inside-wrapped contacts for electronic devicesCHIPSCALE INC·Filed 1997·Granted May 18, 1999·31 cites·24 claims
- 4567US9857418B2Electronics tester with group and individual current configurationsAEHR TEST SYSTEMS·Filed 2016·Granted Jan 2, 2018·0 cites·9 claims
- 4667US7541822B2Wafer burn-in and text employing detachable cartridgeAEHR TEST SYSTEMS·Filed 2006·Granted Jun 2, 2009·3 cites·15 claims
- 4767US2025251438A1Tester apparatus, testing method and leakage detection circuitAEHR TEST SYSTEMS·Filed 2025·Application pending·0 cites
- 4866US10677843B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2015·Granted Jun 9, 2020·0 cites·56 claims
- 4965US9500702B2Electronics tester with hot fluid thermal controlAEHR TEST SYSTEMS·Filed 2016·Granted Nov 22, 2016·0 cites·13 claims
- 5065US6355981B1Wafer fabrication of inside-wrapped contacts for electronic devicesCHIPSCALE INC·Filed 1999·Granted Mar 12, 2002·26 cites·24 claims
Showing the top 50 of 61 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →