Inventor · disambiguated record
Duane Champoux
Also filed as: CHAMPOUX DUANE · CHAMPOUX DUANE A
14 granted patents·1 pending application·157 citations·filing 1997–2021
92Inventor score
Top patents by PatentIndex Score
15 records- 0196US10288681B2Test architecture with a small form factor test board for rapid prototypingADVANTEST CORP·Filed 2018·Granted May 14, 2019·11 cites·27 claims
- 0295US11009550B2Test architecture with an FPGA based test board to simulate a DUT or end-pointADVANTEST CORP·Filed 2018·Granted May 18, 2021·9 cites·20 claims
- 0394US10884847B1Fast parallel CRC determination to support SSD testingADVANTEST CORP·Filed 2019·Granted Jan 5, 2021·14 cites·20 claims
- 0487US12055581B2Software directed firmware accelerationADVANTEST CORP·Filed 2020·Granted Aug 6, 2024·2 cites·16 claims
- 0587US10929260B2Traffic capture and debugging tools for identifying root causes of device failure during automated testingADVANTEST CORP·Filed 2018·Granted Feb 23, 2021·6 cites·18 claims
- 0684US10379158B2Real-time capture of traffic upon failure for protocol debugADVANTEST CORP·Filed 2017·Granted Aug 13, 2019·4 cites·19 claims
- 0770US5925145AIntegrated circuit tester with cached vector memoriesCREDENCE SYSTEMS CORP·Filed 1997·Granted Jul 20, 1999·34 cites·20 claims
- 0869US10955461B2Smart and efficient protocol logic analyzer configured within automated test equipment (ATE) hardwareADVANTEST CORP·Filed 2018·Granted Mar 23, 2021·1 cites·17 claims
- 0963US5805610AVirtual channel data distribution system for integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Sep 8, 1998·27 cites·12 claims
- 1061US5838694ADual source data distribution system for integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Nov 17, 1998·25 cites·14 claims
- 1159US5894484AIntegrated circuit tester with distributed instruction processingCREDENCE SYSTEMS CORP·Filed 1997·Granted Apr 13, 1999·24 cites·9 claims
- 1250US11137910B2Fast address to sector number/offset translation to support odd sector size testingADVANTEST CORP·Filed 2019·Granted Oct 5, 2021·0 cites·20 claims
- 1349US12135352B2Random number generation testing systems and methodsADVANTEST CORP·Filed 2021·Granted Nov 5, 2024·0 cites·20 claims
- 1441US11237202B2Non-standard sector size system support for SSD testingADVANTEST CORP·Filed 2019·Granted Feb 1, 2022·0 cites·20 claims
- 1540US2019278645A1Log post-processor for identifying root causes of device failure during automated testingADVANTEST CORP·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →