Inventor · disambiguated record
Edmundo De La Puente
Also filed as: DE LA PUENTE EDMUNDO · DE LA PUENTE SR EDMUNDO
20 granted patents·3 pending applications·259 citations·filing 2000–2023
94Inventor score
Files withADVANTEST CORP8VERIGY PTE LTD SINGAPORE5AGILENT TECHNOLOGIES INC4DE LA PUENTE EDMUNDO3ADVANTEST SINGAPORE PTE LTD2
Top patents by PatentIndex Score
23 records- 0191US6671844B1Memory tester tests multiple DUT's per test siteAGILENT TECHNOLOGIES INC·Filed 2000·Granted Dec 30, 2003·73 cites·2 claims
- 0289US7743304B2Test system and method for testing electronic devices using a pipelined testing architectureVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jun 22, 2010·17 cites·20 claims
- 0389US6779140B2Algorithmically programmable memory tester with test sites operating in a slave modeAGILENT TECHNOLOGIES INC·Filed 2001·Granted Aug 17, 2004·56 cites·9 claims
- 0487US7279919B2Systems and methods of allocating device testing resources to sites of a probe cardVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Oct 9, 2007·16 cites·28 claims
- 0586US12079098B2Automated test equipment with hardware acceleratorADVANTEST CORP·Filed 2020·Granted Sep 3, 2024·2 cites·11 claims
- 0685US6320812B1Error catch RAM for memory tester has SDRAM memory sets configurable for size and speedAGILENT TECHNOLOGIES INC·Filed 2000·Granted Nov 20, 2001·51 cites·10 claims
- 0781US8347156B2Test system and method for testing electronic devices using a pipelined testing architectureADVANTEST SINGAPORE PTE LTD·Filed 2010·Granted Jan 1, 2013·4 cites·20 claims
- 0876US8242796B2Transmit/receive unit, and methods and apparatus for transmitting signals between transmit/receive unitsDE LA PUENTE EDMUNDO·Filed 2008·Granted Aug 14, 2012·7 cites·10 claims
- 0966US7076714B2Memory tester uses arbitrary dynamic mappings to serialize vectors into transmitted sub-vectors and de-serialize received sub-vectors into vectorsAGILENT TECHNOLOGIES INC·Filed 2003·Granted Jul 11, 2006·18 cites·3 claims
- 1065US8384410B1Parallel test circuit with active devicesADVANTEST SINGAPORE PTE LTD·Filed 2008·Granted Feb 26, 2013·4 cites·15 claims
- 1164US12216163B2Systems and methods of testing devices using CXL for increased parallelismADVANTEST CORP·Filed 2023·Granted Feb 4, 2025·0 cites·10 claims
- 1263US7262620B2Resource matrix, system, and method for operating sameVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Aug 28, 2007·4 cites·18 claims
- 1362US9330792B2Testing memory devices with distributed processing operationsADVANTEST CORP·Filed 2014·Granted May 3, 2016·3 cites·20 claims
- 1457US2024118340A1Processor test pattern generation and application for tester systemsADVANTEST CORP·Filed 2023·Application pending·0 cites
- 1553US10914784B2Method and apparatus for providing UFS terminated and unterminated pulse width modulation support using dual channelsADVANTEST CORP·Filed 2019·Granted Feb 9, 2021·0 cites·20 claims
- 1652US12293802B2Memory queue operations to increase throughput in an ATE systemADVANTEST CORP·Filed 2023·Granted May 6, 2025·0 cites·21 claims
- 1751US8149901B2Channel switching circuitDE LA PUENTE SR EDMUNDO·Filed 2005·Granted Apr 3, 2012·3 cites·19 claims
- 1851US2024094287A1Low power environment for high performance processor without low power modeADVANTEST CORP·Filed 2023·Application pending·0 cites
- 1950US7480583B2Methods and apparatus for testing a circuitVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 20, 2009·1 cites·13 claims
- 2045US2015015284A1Transmit/receive unit, and methods and apparatus for transmitting signals between transmit/receive unitsDE LA PUENTE EDMUNDO·Filed 2012·Application pending·0 cites
- 2143US7928755B2Methods and apparatus that selectively use or bypass a remote pin electronics block to test at least one device under testVERIGY PTE LTD SINGAPORE·Filed 2008·Granted Apr 19, 2011·0 cites·10 claims
- 2239US9612272B2Testing memory devices with parallel processing operationsADVANTEST CORP·Filed 2014·Granted Apr 4, 2017·0 cites·20 claims
- 2334US9557372B2Tester having an application specific electronics module, and systems and methods that incorporate or use the sameDE LA PUENTE EDMUNDO·Filed 2010·Granted Jan 31, 2017·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →