Inventor · disambiguated record
Ehud Tirosh
Also filed as: TIROSH EHUD
25 granted patents·3 pending applications·1,462 citations·filing 1991–2024
97Inventor score
Files withAPPLIED MATERIALS INC9APPLIED MATERIALS ISRAEL LTD8VEERIDE GEO LTD3VEERIDE LTD2APPLIED MATERIALS SOUTH EAST A1
Top patents by PatentIndex Score
28 records- 0197US6268093B1Method for reticle inspection using aerial imagingAPPLIED MATERIALS INC·Filed 1999·Granted Jul 31, 2001·205 cites·32 claims
- 0297US5699447ATwo-phase optical inspection method and apparatus for defect detectionORBOT INSTR LTD·Filed 1991·Granted Dec 16, 1997·311 cites·16 claims
- 0396US6178257B1Substrate inspection method and apparatusAPPLIED MATERIALS INC·Filed 1999·Granted Jan 23, 2001·178 cites·17 claims
- 0495US6175645B1Optical inspection method and apparatusAPPLIED MATERIALS INC·Filed 1998·Granted Jan 16, 2001·175 cites·55 claims
- 0594US7133548B2Method and apparatus for reticle inspection using aerial imagingAPPLIED MATERIALS INC·Filed 2001·Granted Nov 7, 2006·53 cites·31 claims
- 0694US5982921AOptical inspection method and apparatusAPPLIED MATERIALS INC·Filed 1997·Granted Nov 9, 1999·103 cites·26 claims
- 0793US7796807B2Optical inspection apparatus for substrate defect detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2009·Granted Sep 14, 2010·18 cites·9 claims
- 0891US5491517ASystem for implanting an image into a video streamSCITEX AMERICA CORP·Filed 1995·Granted Feb 13, 1996·224 cites·8 claims
- 0989US7521700B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Apr 21, 2009·10 cites·12 claims
- 1089US6952491B2Optical inspection apparatus for substrate defect detectionAPPLIED MATERIALS INC·Filed 2001·Granted Oct 4, 2005·27 cites·10 claims
- 1186US7842935B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Nov 30, 2010·7 cites·66 claims
- 1285US11812342B2Cellular-based navigation methodVEERIDE GEO LTD·Filed 2020·Granted Nov 7, 2023·2 cites·9 claims
- 1383US7499583B2Optical inspection method for substrate defect detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Mar 3, 2009·15 cites·1 claims
- 1483US7355689B2Automatic optical inspection using multiple objectivesAPPLIED MATERIALS INC·Filed 2005·Granted Apr 8, 2008·7 cites·28 claims
- 1582US5731846AMethod and system for perspectively distoring an image and implanting same into a video streamSCIDEL TECHNOLOGIES LTD·Filed 1996·Granted Mar 24, 1998·91 cites·12 claims
- 1678US7098468B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS INC·Filed 2003·Granted Aug 29, 2006·14 cites·66 claims
- 1777US2025164647A1Proximity-based navigation methodVEERIDE GEO LTD·Filed 2024·Application pending·0 cites
- 1875US7826049B2Inspection tools supporting multiple operating states for multiple detector arrangementsAPPLIED MATERIALS SOUTH EAST A·Filed 2008·Granted Nov 2, 2010·4 cites·27 claims
- 1975US7599075B2Automatic optical inspection using multiple objectivesAPPLIED MATERIALS ISRAEL LTD·Filed 2008·Granted Oct 6, 2009·3 cites·20 claims
- 2072US7394531B2Apparatus and method for automatic optical inspectionAPPLIED MATERIALS INC·Filed 2006·Granted Jul 1, 2008·2 cites·20 claims
- 2167US7846649B2High resolution printer and a method for high resolution printingAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Dec 7, 2010·9 cites·13 claims
- 2264US11347082B2Smartphone-assisted portable augmented reality (AR) device and clip-on unit for adjustable attachment to a user's spectaclesVEERIDE LTD·Filed 2019·Granted May 31, 2022·1 cites·19 claims
- 2364US10962778B2Apparatus and method for augmented realityVEERIDE LTD·Filed 2017·Granted Mar 30, 2021·1 cites·19 claims
- 2461US12078735B2Proximity-based navigation methodVEERIDE GEO LTD·Filed 2021·Granted Sep 3, 2024·0 cites·8 claims
- 2558US7844103B2Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods useful thereforAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Nov 30, 2010·2 cites·18 claims
- 2644US2012268939A1Method of laser processingFINAROV MOSHE·Filed 2012·Application pending·0 cites
- 2740US2005169635A1Method and system for free-space communicationFiled 2003·Application pending·0 cites
- 2838US7518391B2Probe card and a method for detecting defects using a probe card and an additional inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Apr 14, 2009·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →