Inventor · disambiguated record
Einat Peled
Also filed as: PELED EINAT
5 granted patents·1 citations·filing 2017–2023
60Inventor score
Top patents by PatentIndex Score
5 records- 0166US10699969B2Quick adjustment of metrology measurement parameters according to process variationKLA TENCOR CORP·Filed 2018·Granted Jun 30, 2020·1 cites·14 claims
- 0256US11861824B1Reference image grouping in overlay metrologyKLA CORP·Filed 2023·Granted Jan 2, 2024·0 cites·25 claims
- 0346US11615974B2Fab management with dynamic sampling plans, optimized wafer measurement paths and optimized wafer transport, using quantum computingKLA CORP·Filed 2019·Granted Mar 28, 2023·0 cites·30 claims
- 0441US11158548B2Overlay measurement using multiple wavelengthsKLA TENCOR CORP·Filed 2018·Granted Oct 26, 2021·0 cites·11 claims
- 0540US10504802B2Target location in semiconductor manufacturingKLA TENCOR CORP·Filed 2017·Granted Dec 10, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →