Inventor · disambiguated record
Ellen Laird
Also filed as: LAIRD ELLEN · LAIRD ELLEN R
6 granted patents·108 citations·filing 1995–2007
85Inventor score
Top patents by PatentIndex Score
6 records- 0183US6358860B1Line width calibration standard manufacturing and certifying methodVLSI STANDARDS INC·Filed 2000·Granted Mar 19, 2002·30 cites·44 claims
- 0282US6646737B2Submicron dimensional calibration standards and methods of manufacture and useKLA TENCOR TECHNOLOGIES·Filed 2001·Granted Nov 11, 2003·19 cites·49 claims
- 0374US5599464AFormation of atomic scale vertical features for topographic instrument calibrationVLSI STANDARDS INC·Filed 1995·Granted Feb 4, 1997·38 cites·24 claims
- 0459US7453571B1Dimensional calibration standardsKLA TENCOR CORP·Filed 2007·Granted Nov 18, 2008·3 cites·28 claims
- 0556US7301638B1Dimensional calibration standardsKLA TENCOR INC·Filed 2004·Granted Nov 27, 2007·8 cites·41 claims
- 0642US5677765AMethod for calibrating a topographic instrumentVLSI STANDARDS INC·Filed 1996·Granted Oct 14, 1997·10 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →