Inventor · disambiguated record
Eliezer Rosengaus
Also filed as: ROSENGAUS ELIEZER
37 granted patents·1 pending application·1,298 citations·filing 1987–2021
98Inventor score
Top patents by PatentIndex Score
38 records- 0196US10498963B1Motion extracted high dynamic range imagesAMAZON TECH INC·Filed 2017·Granted Dec 3, 2019·18 cites·20 claims
- 0296US6020957ASystem and method for inspecting semiconductor wafersKLA TENCOR CORP·Filed 1998·Granted Feb 1, 2000·205 cites·38 claims
- 0395US9222771B2Acquisition of information for a construction siteKLA TENCOR CORP·Filed 2012·Granted Dec 29, 2015·36 cites·37 claims
- 0495US8126255B2Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functionsBHASKAR KRIS·Filed 2008·Granted Feb 28, 2012·174 cites·61 claims
- 0595US4755874AEmission microscopy systemKLA INSTR CORP·Filed 1987·Granted Jul 5, 1988·219 cites·27 claims
- 0694US9041930B1Digital pathology systemYOUNG SCOTT·Filed 2011·Granted May 26, 2015·32 cites·22 claims
- 0794US7724362B1Oblique incidence macro wafer inspectionKLA TENCOR CORP·Filed 2007·Granted May 25, 2010·26 cites·34 claims
- 0893US9068917B1Systems and methods for inspection of a specimenVAEZ-IRAVANI MEHDI·Filed 2006·Granted Jun 30, 2015·22 cites·23 claims
- 0993US8600143B1Method and system for hierarchical tissue analysis and classificationKULKARNI ASHOK V·Filed 2011·Granted Dec 3, 2013·46 cites·25 claims
- 1093US7719677B2Multi-spectral techniques for defocus detectionKLA TENCOR CORP·Filed 2008·Granted May 18, 2010·18 cites·25 claims
- 1192US7227628B1Wafer inspection systems and methods for analyzing inspection dataKLA TENCOR TECH CORP·Filed 2004·Granted Jun 5, 2007·58 cites·30 claims
- 1291US10863105B1High dynamic range imaging for event detection and inventory managementAMAZON TECH INC·Filed 2017·Granted Dec 8, 2020·13 cites·20 claims
- 1391US7555409B1Daisy chained topologyKLA TENCOR CORP·Filed 2004·Granted Jun 30, 2009·48 cites·17 claims
- 1491US7072034B2Systems and methods for inspection of specimen surfacesKLA TENCOR CORP·Filed 2001·Granted Jul 4, 2006·48 cites·75 claims
- 1590US7417724B1Wafer inspection systems and methods for analyzing inspection dataKLA TENCOR TECH CORP·Filed 2007·Granted Aug 26, 2008·14 cites·32 claims
- 1690US6796697B1Illumination delivery systemKLA TENCOR INC·Filed 2002·Granted Sep 28, 2004·61 cites·59 claims
- 1788US11265481B1Aligning and blending image data from multiple image sensorsAMAZON TECH INC·Filed 2020·Granted Mar 1, 2022·2 cites·20 claims
- 1888US7397553B1Surface scanningKLA TENCOR TECH CORP·Filed 2005·Granted Jul 8, 2008·13 cites·15 claims
- 1985US7280197B1Wafer edge inspection apparatusKLA TEHCOR TECHNOLOGIES CORP·Filed 2004·Granted Oct 9, 2007·35 cites·33 claims
- 2084US7142300B2Edge bead removal inspection by reflectometryKLA TENCOR CORP TECHNOLOGIES·Filed 2004·Granted Nov 28, 2006·26 cites·14 claims
- 2184US5653539AMethod and apparatus for remotely measuring the temperature of a surfaceFiled 1994·Granted Aug 5, 1997·56 cites·13 claims
- 2279US6791680B1System and method for inspecting semiconductor wafersKLA TENCOR CORP·Filed 1999·Granted Sep 14, 2004·49 cites·16 claims
- 2377US10999506B1Generating motion extracted imagesAMAZON TECH INC·Filed 2019·Granted May 4, 2021·1 cites·20 claims
- 2476US7176433B1Resolution enhancement for macro wafer inspectionKLA TEACOR TECHNOLOGIES CORP·Filed 2004·Granted Feb 13, 2007·25 cites·19 claims
- 2575US10535131B2Systems and methods for region-adaptive defect detectionKLA TENCOR CORP·Filed 2016·Granted Jan 14, 2020·3 cites·54 claims
- 2674US7251586B2Full swath analysisKLA TENCOR TECH CORP·Filed 2005·Granted Jul 31, 2007·6 cites·5 claims
- 2773US11204330B1Systems and methods for inspection of a specimenKLA TENCOR TECH CORPORATION·Filed 2015·Granted Dec 21, 2021·1 cites·86 claims
- 2870US7865037B1Memory load balancingKLA TENCOR CORP·Filed 2006·Granted Jan 4, 2011·2 cites·12 claims
- 2969US7149642B1Programmable image computerKLA TENCOR TECH CORP·Filed 2004·Granted Dec 12, 2006·7 cites·17 claims
- 3068US7024339B1Full swath analysisKLA TENCOR TECH CORP·Filed 2004·Granted Apr 4, 2006·12 cites·16 claims
- 3166US7076390B1Memory load balancingKLA TENCOR TECH CORP·Filed 2004·Granted Jul 11, 2006·5 cites·19 claims
- 3264US7181368B1Status pollingKLA TENCOR TECH CORP·Filed 2004·Granted Feb 20, 2007·9 cites·16 claims
- 3362US11863869B1Event detection using motion extracted image comparisonAMAZON TECH INC·Filed 2021·Granted Jan 2, 2024·0 cites·20 claims
- 3460US7379838B2Programmable image computerKLA TENCOR CORP·Filed 2006·Granted May 27, 2008·2 cites·1 claims
- 3555US8645100B2Status pollingBHASKAR KRISHNAMURTHY·Filed 2007·Granted Feb 4, 2014·1 cites·8 claims
- 3654US7324198B2Edge bead removal inspection by reflectometryKLA TENCOR CORP·Filed 2006·Granted Jan 29, 2008·0 cites·20 claims
- 3752US2006164649A1Multi-spectral techniques for defocus detectionROSENGAUS ELIEZER·Filed 2005·Application pending·0 cites
- 3849US7602958B1Mirror node process verificationKLA TENCOR CORP·Filed 2004·Granted Oct 13, 2009·5 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →