Inventor · disambiguated record
Emmanuel Drege
Also filed as: DREGE EMMANUEL
18 granted patents·2 pending applications·325 citations·filing 2002–2009
95Inventor score
Top patents by PatentIndex Score
20 records- 0195US7330279B2Model and parameter selection for optical metrologyTIMBRE TECH INC·Filed 2002·Granted Feb 12, 2008·58 cites·52 claims
- 0294US7831528B2Optical metrology of structures formed on semiconductor wafers using machine learning systemsTOKYO ELECTRON LTD·Filed 2009·Granted Nov 9, 2010·29 cites·29 claims
- 0391US7588949B2Optical metrology model optimization based on goalsTOKYO ELECTRON LTD·Filed 2007·Granted Sep 15, 2009·11 cites·23 claims
- 0491US7171284B2Optical metrology model optimization based on goalsTIMBRE TECH INC·Filed 2004·Granted Jan 30, 2007·49 cites·55 claims
- 0591US7046375B2Edge roughness measurement in optical metrologyTIMBRE TECH INC·Filed 2003·Granted May 16, 2006·41 cites·46 claims
- 0688US7694244B2Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturingCADENCE DESIGN SYSTEMS INC·Filed 2006·Granted Apr 6, 2010·19 cites·15 claims
- 0782US8407630B1Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturingCHAN KEVIN·Filed 2009·Granted Mar 26, 2013·11 cites·20 claims
- 0882US7505153B2Model and parameter selection for optical metrologyTIMBRE TECH INC·Filed 2008·Granted Mar 17, 2009·5 cites·19 claims
- 0982US6853942B2Metrology hardware adaptation with universal libraryTIMBRE TECH INC·Filed 2002·Granted Feb 8, 2005·20 cites·62 claims
- 1079US7216045B2Selection of wavelengths for integrated circuit optical metrologyTIMBRE TECH INC·Filed 2002·Granted May 8, 2007·22 cites·2 claims
- 1178US8302052B2Methods, systems, and computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit designLEE BRIAN·Filed 2009·Granted Oct 30, 2012·10 cites·34 claims
- 1276US7665048B2Method and system for inspection optimization in design and production of integrated circuitsCADENCE DESIGN SYSTEMS INC·Filed 2006·Granted Feb 16, 2010·8 cites·20 claims
- 1375US7523076B2Selecting a profile model for use in optical metrology using a machine learning systemTOKYO ELECTRON LTD·Filed 2004·Granted Apr 21, 2009·13 cites·47 claims
- 1475US6842261B2Integrated circuit profile value determinationTIMBRE TECH INC·Filed 2002·Granted Jan 11, 2005·14 cites·45 claims
- 1565US8146024B2Method and system for process optimizationCHAN KEVIN·Filed 2006·Granted Mar 27, 2012·4 cites·21 claims
- 1663US7394554B2Selecting a hypothetical profile to use in optical metrologyTIMBRE TECH INC·Filed 2003·Granted Jul 1, 2008·10 cites·32 claims
- 1756US8156450B2Method and system for mask optimizationCHAN KEVIN·Filed 2006·Granted Apr 10, 2012·1 cites·24 claims
- 1844US7474993B2Selection of wavelengths for integrated circuit optical metrologyTIMBRE TECH INC·Filed 2007·Granted Jan 6, 2009·0 cites·20 claims
- 1939US2004267397A1Optical metrology of structures formed on semiconductor wafer using machine learning systemsFiled 2003·Application pending·0 cites
- 2037US2004090629A1Diffraction order selection for optical metrology simulationFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →