Inventor · disambiguated record
Emil Kamieniecki
Also filed as: KAMIENIECKI EMIL
26 granted patents·2 pending applications·873 citations·filing 1982–2018
97Inventor score
Files withKAMIENIECKI EMIL9QC SOLUTIONS INC9SEMITEST INC4OPTICAL DIAGNOSTIC SYSTEMS INC3GTE LABORATORIES INC1
Top patents by PatentIndex Score
28 records- 0195US5091691AApparatus for making surface photovoltage measurements of a semiconductorSEMITEST INC·Filed 1988·Granted Feb 25, 1992·132 cites·19 claims
- 0294US5661408AReal-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 1995·Granted Aug 26, 1997·128 cites·39 claims
- 0394US4891584AApparatus for making surface photovoltage measurements of a semiconductorSEMITEST INC·Filed 1988·Granted Jan 2, 1990·218 cites·37 claims
- 0492US4663526ANondestructive readout of a latent electrostatic image formed on an insulating materialKAMIENIECKI EMIL·Filed 1985·Granted May 5, 1987·34 cites·42 claims
- 0590US4827212ANoninvasive method and apparatus for characterization of semiconductorsSEMITEST INC·Filed 1988·Granted May 2, 1989·63 cites·9 claims
- 0688US8232817B2Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductorKAMIENIECKI EMIL·Filed 2010·Granted Jul 31, 2012·6 cites·17 claims
- 0788US7898280B2Electrical characterization of semiconductor materialsKAMIENIECKI EMIL·Filed 2008·Granted Mar 1, 2011·13 cites·12 claims
- 0886US6315574B1Method for real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2000·Granted Nov 13, 2001·24 cites·18 claims
- 0984US6388455B1Method and apparatus for simulating a surface photo-voltage in a substrateQC SOLUTIONS INC·Filed 2000·Granted May 14, 2002·47 cites·27 claims
- 1083US10018738B2Inductive radiation detectorKAMIENIECKI EMIL·Filed 2017·Granted Jul 10, 2018·2 cites·20 claims
- 1182US4544887AMethod of measuring photo-induced voltage at the surface of semiconductor materialsGTE LABORATORIES INC·Filed 1982·Granted Oct 1, 1985·34 cites·4 claims
- 1281US10429522B1Electrostatic hole trapping radiation detectorsKAMIENIECKI EMIL·Filed 2018·Granted Oct 1, 2019·2 cites·14 claims
- 1381US8896338B2Electrical characterization of semiconductor materialsKAMIENIECKI EMIL·Filed 2012·Granted Nov 25, 2014·5 cites·16 claims
- 1479US6803588B2Apparatus and method for rapid photo-thermal surfaces treatmentQC SOLUTIONS INC·Filed 2001·Granted Oct 12, 2004·19 cites·9 claims
- 1575US6325078B2Apparatus and method for rapid photo-thermal surface treatmentQC SOLUTIONS INC·Filed 1998·Granted Dec 4, 2001·39 cites·15 claims
- 1674US5087876AApparatus and method for making surface photovoltage measurements of a semiconductorSEMITEST INC·Filed 1990·Granted Feb 11, 1992·42 cites·14 claims
- 1772US6069017AMethod for real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 1997·Granted May 30, 2000·25 cites·2 claims
- 1867US7663385B2Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductorNANOMETRICS INC·Filed 2003·Granted Feb 16, 2010·9 cites·11 claims
- 1965US6909302B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2001·Granted Jun 21, 2005·6 cites·5 claims
- 2062US10338237B2Inductive radiation detectorKAMIENIECKI EMIL·Filed 2018·Granted Jul 2, 2019·0 cites·11 claims
- 2156US6967490B1Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2003·Granted Nov 22, 2005·3 cites·16 claims
- 2255US4873436ANondestructive readout of a latent electrostatic image formed on an insulating materialOPTICAL DIAGNOSTIC SYSTEMS INC·Filed 1987·Granted Oct 10, 1989·12 cites·13 claims
- 2353US9110127B2Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductorKAMIENIECKI EMIL·Filed 2012·Granted Aug 18, 2015·0 cites·15 claims
- 2453US6924657B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2003·Granted Aug 2, 2005·2 cites·15 claims
- 2548US4847496ANondestructive readout of a latent electrostatic image formed on an insulated materialOPTICAL DIAGNOSTIC SYSTEMS INC·Filed 1987·Granted Jul 11, 1989·5 cites·13 claims
- 2639US2011301892A1System and method for characterizing the electrical properties of a semiconductor sampleKAMIENIECKI EMIL·Filed 2011·Application pending·0 cites
- 2734US4833324ANondestructive readout of a latent electrostatic image formed on an insulating materialOPTICAL DIAGNOSTIC SYSTEMS INC·Filed 1987·Granted May 23, 1989·3 cites·12 claims
- 2831US2002036774A1Apparatus and method for handling and testing of wafersFiled 2001·Application pending·0 cites
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