Inventor · disambiguated record
Etay Lavert
Also filed as: LAVERT ETAY
6 granted patents·1 pending application·4 citations·filing 2017–2023
70Inventor score
Top patents by PatentIndex Score
7 records- 0187US12111580B2Optical metrology utilizing short-wave infrared wavelengthsKLA CORP·Filed 2021·Granted Oct 8, 2024·2 cites·38 claims
- 0286US11556738B2System and method for determining target feature focus in image-based overlay metrologyKLA CORP·Filed 2020·Granted Jan 17, 2023·2 cites·21 claims
- 0370US11921825B2System and method for determining target feature focus in image-based overlay metrologyKLA CORP·Filed 2023·Granted Mar 5, 2024·0 cites·21 claims
- 0460US11237120B2Expediting spectral measurement in semiconductor device fabricationKLA TENCOR CORP·Filed 2020·Granted Feb 1, 2022·0 cites·14 claims
- 0556US2023324809A1Extra tall target metrologyKLA CORP·Filed 2022·Application pending·0 cites
- 0653US12131959B2Systems and methods for improved metrology for semiconductor device wafersKLA CORP·Filed 2021·Granted Oct 29, 2024·0 cites·24 claims
- 0747US10761034B2Expediting spectral measurement in semiconductor device fabricationKLA TENCOR CORP·Filed 2017·Granted Sep 1, 2020·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →