Inventor · disambiguated record
Frank Riepenhausen
Also filed as: RIEPENHAUSEN FRANK
3 granted patents·1 pending application·20 citations·filing 2009–2020
64Inventor score
Top patents by PatentIndex Score
4 records- 0181US8269981B1Method and an apparatus for measuring a deviation of an optical test surface from a target shapeDOERBAND BERND·Filed 2009·Granted Sep 18, 2012·17 cites·26 claims
- 0277US11118900B2Method and device for characterizing the surface shape of an optical elementZEISS CARL SMT GMBH·Filed 2020·Granted Sep 14, 2021·1 cites·9 claims
- 0363US8593642B2Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring deviceFREIMANN ROLF·Filed 2012·Granted Nov 26, 2013·2 cites·13 claims
- 0449US2014078513A1Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring deviceZEISS CARL SMT GMBH·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →