Inventor · disambiguated record
Gad Neumann
Also filed as: NEUMANN GAD
14 granted patents·810 citations·filing 1991–2009
95Inventor score
Files withNEGEVTECH LTD4APPLIED MATERIALS INC3APPLIED MATERIALS ISRAEL LTD2APPLIED MATERIALS SEA PTE LTD2APPLIED MATERIALS SOUTH EAST A1
Top patents by PatentIndex Score
14 records- 0197US5699447ATwo-phase optical inspection method and apparatus for defect detectionORBOT INSTR LTD·Filed 1991·Granted Dec 16, 1997·311 cites·16 claims
- 0296US6178257B1Substrate inspection method and apparatusAPPLIED MATERIALS INC·Filed 1999·Granted Jan 23, 2001·178 cites·17 claims
- 0394US5982921AOptical inspection method and apparatusAPPLIED MATERIALS INC·Filed 1997·Granted Nov 9, 1999·103 cites·26 claims
- 0493US7796807B2Optical inspection apparatus for substrate defect detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2009·Granted Sep 14, 2010·18 cites·9 claims
- 0593US7633041B2Apparatus for determining optimum position of focus of an imaging systemAPPLIED MATERIALS SOUTH EAST A·Filed 2006·Granted Dec 15, 2009·20 cites·10 claims
- 0691US7961763B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Jun 14, 2011·14 cites·6 claims
- 0789US7180586B2System for detection of wafer defectsNEGEVTECH LTD·Filed 2004·Granted Feb 20, 2007·29 cites·12 claims
- 0889US6952491B2Optical inspection apparatus for substrate defect detectionAPPLIED MATERIALS INC·Filed 2001·Granted Oct 4, 2005·27 cites·10 claims
- 0987US6892013B2Fiber optical illumination systemNEGEVTECH LTD·Filed 2003·Granted May 10, 2005·32 cites·14 claims
- 1086US6693664B2Method and system for fast on-line electro-optical detection of wafer defectsNEGEVTECH·Filed 2002·Granted Feb 17, 2004·38 cites·28 claims
- 1185US7843559B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Nov 30, 2010·7 cites·16 claims
- 1283US7499583B2Optical inspection method for substrate defect detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Mar 3, 2009·15 cites·1 claims
- 1381US7477383B2System for detection of wafer defectsNEGEVTECH LTD·Filed 2006·Granted Jan 13, 2009·5 cites·15 claims
- 1476US7525659B2System for detection of water defectsNEGEVTECH LTD·Filed 2003·Granted Apr 28, 2009·13 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →