Inventor · disambiguated record
Gershon Perelman
Also filed as: PERELMAN GERSHON
23 granted patents·2 pending applications·566 citations·filing 1997–2022
96Inventor score
Files withAGILENT TECHNOLOGIES INC9KLA TENCOR CORP6KLA TENCOR TECH CORP2THERMO FINNIGAN LLC2MORRISON STEVEN1
Top patents by PatentIndex Score
25 records- 0197US6288780B1High throughput brightfield/darkfield wafer inspection system using advanced optical techniquesKLA TENCOR TECH CORP·Filed 1997·Granted Sep 11, 2001·207 cites·26 claims
- 0295US7675031B2Auxiliary drag field electrodesTHERMO FINNIGAN LLC·Filed 2008·Granted Mar 9, 2010·54 cites·20 claims
- 0395US6816249B2High throughput brightfield/darkfield wafer inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2001·Granted Nov 9, 2004·49 cites·35 claims
- 0492US7554655B2High throughput brightfield/darkfield water inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2008·Granted Jun 30, 2009·16 cites·21 claims
- 0590US10145753B2Apparatus and method for dynamically balancing rotorsAGILENT TECHNOLOGIES INC·Filed 2015·Granted Dec 4, 2018·18 cites·20 claims
- 0688US9053915B2Radio frequency (RF) ion guide for improved performance in mass spectrometers at high pressureAGILENT TECHNOLOGIES INC·Filed 2012·Granted Jun 9, 2015·10 cites·9 claims
- 0788US6998607B1Temperature compensated time-of-flight mass spectrometerTHERMO FINNIGAN LLC·Filed 2004·Granted Feb 14, 2006·34 cites·23 claims
- 0886US11515137B2Ion guide with varying multipolesAGILENT TECHNOLOGIES INC·Filed 2021·Granted Nov 29, 2022·1 cites·20 claims
- 0986US9589775B2Plasma cleaning for mass spectrometersAGILENT TECHNOLOGIES INC·Filed 2015·Granted Mar 7, 2017·5 cites·17 claims
- 1086US7164475B2High throughput brightfield/darkfield wafer inspection system using advanced optical techniquesKLA TENCOR TECH CORP·Filed 2004·Granted Jan 16, 2007·17 cites·32 claims
- 1184US5970168AFourier filtering mechanism for inspecting wafersKLA TENCOR CORP·Filed 1997·Granted Oct 19, 1999·78 cites·21 claims
- 1281US10010884B1Droplet actuation enhancement using oscillatory sliding motion between substrates in microfluidic devicesAGILENT TECHNOLOGIES INC·Filed 2014·Granted Jul 3, 2018·6 cites·17 claims
- 1379US9153427B2Vacuum ultraviolet photon source, ionization apparatus, and related methodsAGILENT TECHNOLOGIES INC·Filed 2013·Granted Oct 6, 2015·4 cites·19 claims
- 1478US6498891B1FBG stretching mechanism with integrated thermal compensationPHAETHON COMM·Filed 2001·Granted Dec 24, 2002·25 cites·41 claims
- 1577US12119214B2Ion guide with varying multipolesAGILENT TECHNOLOGIES INC·Filed 2022·Granted Oct 15, 2024·0 cites·20 claims
- 1677US7379173B2High throughput brightfield/darkfield wafer inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2004·Granted May 27, 2008·9 cites·25 claims
- 1774US7259844B2High throughput darkfield/brightfield wafer inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2007·Granted Aug 21, 2007·2 cites·20 claims
- 1873US9449805B2Isolation of charged particle optics from vacuum chamber deformationsAGILENT TECHNOLOGIES INC·Filed 2014·Granted Sep 20, 2016·2 cites·20 claims
- 1973US6928143B2Deployable fast-response apparatus to recover bio-contaminated materialsFiled 2003·Granted Aug 9, 2005·18 cites·23 claims
- 2070US7522275B2High throughput darkfield/brightfield wafer inspection system using advanced optical techniquesKLA TENCOR CORP·Filed 2007·Granted Apr 21, 2009·1 cites·20 claims
- 2167US11791149B2Axially progressive lens for transporting charged particlesAGILENT TECHNOLOGIES INC·Filed 2020·Granted Oct 17, 2023·0 cites·20 claims
- 2263US8859961B2Radio frequency (RF) ion guide for improved performance in mass spectrometersPERELMAN GERSHON·Filed 2012·Granted Oct 14, 2014·2 cites·11 claims
- 2361US6785443B2Optical fiber Bragg grating tuning deviceTERAXION INC·Filed 2002·Granted Aug 31, 2004·8 cites·27 claims
- 2453US2023009117A1Pipe extraction deviceSTEVICK GLEN R·Filed 2022·Application pending·0 cites
- 2544US2009120191A1Methods and apparatus for inspecting furnace tubesMORRISON STEVEN·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →