Inventor · disambiguated record
Gilad Laredo
Also filed as: LAREDO GILAD
11 granted patents·37 citations·filing 2018–2023
85Inventor score
Top patents by PatentIndex Score
11 records- 0197US11346657B2Measurement modes for overlayKLA CORP·Filed 2020·Granted May 31, 2022·7 cites·35 claims
- 0296US11573497B2System and method for measuring misregistration of semiconductor device wafers utilizing induced topographyKLA CORP·Filed 2020·Granted Feb 7, 2023·5 cites·20 claims
- 0396US11073768B2Metrology target for scanning metrologyKLA CORP·Filed 2019·Granted Jul 27, 2021·19 cites·21 claims
- 0493US11899375B2Massive overlay metrology sampling with multiple measurement columnsKLA CORP·Filed 2021·Granted Feb 13, 2024·2 cites·56 claims
- 0588US11281112B2Method of measuring misregistration in the manufacture of topographic semiconductor device wafersKLA CORP·Filed 2020·Granted Mar 22, 2022·2 cites·22 claims
- 0682US11281111B2Off-axis illumination overlay measurement using two-diffracted orders imagingKLA TENCOR CORP·Filed 2018·Granted Mar 22, 2022·2 cites·29 claims
- 0780US12379669B2Massive overlay metrology sampling with multiple measurement columnsKLA CORP·Filed 2023·Granted Aug 5, 2025·0 cites·33 claims
- 0873US11880141B2Method of measuring misregistration in the manufacture of topographic semiconductor device wafersKLA CORP·Filed 2022·Granted Jan 23, 2024·0 cites·24 claims
- 0949US11333616B2Adaptive focusing system for a scanning metrology toolKLA CORP·Filed 2020·Granted May 17, 2022·0 cites·24 claims
- 1047US11512948B2Imaging system for buried metrology targetsKLA CORP·Filed 2020·Granted Nov 29, 2022·0 cites·52 claims
- 1144US11933717B2Sensitive optical metrology in scanning and static modesKLA CORP·Filed 2019·Granted Mar 19, 2024·0 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →