Inventor · disambiguated record
Gunter Igel
Also filed as: IGEL GUENTER · IGEL GUNTER
29 granted patents·2 pending applications·635 citations·filing 1996–2008
97Inventor score
Files withMICRONAS GMBH21ITT IND GMBH DEUTSCHE5MICRONAS INTERMETALL GMBH3GEN SEMICONDUCTOR INC1INABILLION AS1
Top patents by PatentIndex Score
31 records- 0190US6368851B1Method and apparatus for measuring a state variableMICRONAS GMBH·Filed 1999·Granted Apr 9, 2002·129 cites·33 claims
- 0286US6638743B2Method for measuring a state variableMICRONAS GMBH·Filed 2002·Granted Oct 28, 2003·33 cites·16 claims
- 0382US6471838B1Measuring device and process for its manufactureMICRONAS GMBH·Filed 2000·Granted Oct 29, 2002·24 cites·17 claims
- 0481US6191489B1Micromechanical layer stack arrangement particularly for flip chip or similar connectionsMICRONAS GMBH·Filed 2000·Granted Feb 20, 2001·34 cites·9 claims
- 0581US5824595AMethod of separating electronic elementsITT IND GMBH DEUTSCHE·Filed 1996·Granted Oct 20, 1998·66 cites·15 claims
- 0678US5890807AMethod for identifying an apparatus or device utilizing a randomly produced characteristic thereofITT IND GMBH DEUTSCHE·Filed 1996·Granted Apr 6, 1999·55 cites·17 claims
- 0777US6369435B1Semiconductor componentMICRONAS GMBH·Filed 1999·Granted Apr 9, 2002·38 cites·14 claims
- 0875US5789307AMethod of separating electronic devices contained in a carrierITT IND GMBH DEUTSCHE·Filed 1997·Granted Aug 4, 1998·49 cites·20 claims
- 0973US6475760B1Method for intracellular manipulation of a biological cellMICRONAS GMBH·Filed 1999·Granted Nov 5, 2002·26 cites·10 claims
- 1071US6642126B2Process for manufacturing a semiconductor wafer with passivation layer mask for etching with mechanical removalMICRONAS GMBH·Filed 2000·Granted Nov 4, 2003·14 cites·16 claims
- 1167US6572748B1Reference electrodeMICRONAS GMBH·Filed 1999·Granted Jun 3, 2003·41 cites·14 claims
- 1260US7501276B2Apparatus for intracellular manipulation of a biological cellMICRONAS GMBH·Filed 2002·Granted Mar 10, 2009·2 cites·2 claims
- 1359US6225653B1Semiconductor components and methods of manufacturing semiconductor componentsMICRONAS GMBH·Filed 1999·Granted May 1, 2001·18 cites·5 claims
- 1457US6413474B1Measuring deviceMICRONAS GMBH·Filed 1999·Granted Jul 2, 2002·20 cites·18 claims
- 1556US2008220541A1Process for structuring a surface layerMICRONAS GMBH·Filed 2008·Application pending·0 cites
- 1654US6346675B1Coupling and method for its manufactureMICRONAS GMBH·Filed 2000·Granted Feb 12, 2002·5 cites·15 claims
- 1753US6916673B2Method for producing an optical transmitting and receiving device and a transmitting and receiving device produced according to said methodMICRONAS GMBH·Filed 2000·Granted Jul 12, 2005·4 cites·25 claims
- 1848US7720265B2Fingerprint recognition module having a thin-film structure and comprising resistive, temperature-sensitive elementsINABILLION AS·Filed 2003·Granted May 18, 2010·10 cites·19 claims
- 1946US6964927B2Method and production of a sensorMICRONAS GMBH·Filed 2001·Granted Nov 15, 2005·3 cites·18 claims
- 2046US6460416B1Capacitor structure and fabrication processMICRONAS INTERMETALL GMBH·Filed 1998·Granted Oct 8, 2002·11 cites·13 claims
- 2145US5858808AProcess and auxiliary device for fabricating semiconductor devicesITT IND GMBH DEUTSCHE·Filed 1997·Granted Jan 12, 1999·12 cites·12 claims
- 2244US6765394B1Capacitive magnetic field sensorMICRONAS GMBH·Filed 1999·Granted Jul 20, 2004·12 cites·12 claims
- 2343US2004091997A1Process for structuring a surface layerMICRONAS GMBH·Filed 2003·Application pending·0 cites
- 2441US6294218B1Process for coating a substrateMICRONAS GMBH·Filed 1999·Granted Sep 25, 2001·8 cites·13 claims
- 2540US6656678B1Method for examination of a surface layerMICRONAS GMBH·Filed 2000·Granted Dec 2, 2003·0 cites·11 claims
- 2639US5885897AProcess for making contact to differently doped regions in a semiconductor device, and semiconductor deviceITT IND GMBH DEUTSCHE·Filed 1997·Granted Mar 23, 1999·6 cites·15 claims
- 2734US6413440B1Process for manufacturing a micro-electrodeMICRONAS GMBH·Filed 1999·Granted Jul 2, 2002·3 cites·17 claims
- 2833US5944976AProcess for forming adjacent moats or holesMICRONAS INTERMETALL GMBH·Filed 1997·Granted Aug 31, 1999·3 cites·18 claims
- 2933US5933715AProcess for manufacturing discrete electronic devicesMICRONAS INTERMETALL GMBH·Filed 1997·Granted Aug 3, 1999·6 cites·22 claims
- 3032US5976901AProcess for manufacturing semiconductor devices with active structuresGEN SEMICONDUCTOR INC·Filed 1997·Granted Nov 2, 1999·2 cites·14 claims
- 3130US6288440B1Chip arrangementMICRONAS GMBH·Filed 1999·Granted Sep 11, 2001·1 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →