Inventor · disambiguated record
Hawren Fang
Also filed as: FANG HAWREN
5 granted patents·1 pending application·22 citations·filing 2015–2024
75Inventor score
Top patents by PatentIndex Score
6 records- 0188US11270430B2Wafer inspection using difference imagesKLA TENCOR CORP·Filed 2018·Granted Mar 8, 2022·5 cites·18 claims
- 0288US10074036B2Critical dimension uniformity enhancement techniques and apparatusKLA TENCOR CORP·Filed 2015·Granted Sep 11, 2018·6 cites·23 claims
- 0384US11257207B2Inspection of reticles using machine learningKLA TENCOR CORP·Filed 2018·Granted Feb 22, 2022·4 cites·21 claims
- 0480US11468553B2System and method for determining type and size of defects on blank reticlesKLA CORP·Filed 2019·Granted Oct 11, 2022·7 cites·23 claims
- 0568US12094101B2Inspection of reticles using machine learningKLA TENCOR CORP·Filed 2021·Granted Sep 17, 2024·0 cites·19 claims
- 0660US2025356480A1System and method for defect detection using a conditional masked autoencoderKLA CORP·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →