Inventor · disambiguated record
Han-Min Huang
Also filed as: HUANG HAN · HUANG HAN-MIN
9 granted patents·2 pending applications·14 citations·filing 2008–2025
80Inventor score
Files withUNITED MICROELECTRONICS CORP4UNITED SEMICONDUCTOR XIAMEN CO LTD2HUANG HAN1LEE CHUN-YAO1LITE ON TECHNOLOGY CORP1
Top patents by PatentIndex Score
11 records- 0184US11024704B1Manufacturing method of capacitor structureUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2020·Granted Jun 1, 2021·2 cites·20 claims
- 0283US8546880B2Anti punch-through leakage current metal-oxide-semiconductor transistor and manufacturing method thereofLEE CHUN-YAO·Filed 2010·Granted Oct 1, 2013·9 cites·11 claims
- 0366US2025118480A1Magnetic core structureLITE ON TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 0463US8450801B2Lateral-diffusion metal-oxide-semiconductor deviceLin hong-ze·Filed 2010·Granted May 28, 2013·3 cites·19 claims
- 0555US2025072077A1Semiconductor device and method of fabricating the sameUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2023·Application pending·0 cites
- 0650US10854476B2Semiconductor vertical wire bonding structure and methodSJ SEMICONDUCTOR JIANGYIN CORP·Filed 2019·Granted Dec 1, 2020·0 cites·14 claims
- 0749US7982288B2Semiconductor device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2008·Granted Jul 19, 2011·0 cites·17 claims
- 0847US8828827B2Manufacturing method of anti punch-through leakage current metal-oxide-semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 9, 2014·0 cites·9 claims
- 0947US8049279B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2009·Granted Nov 1, 2011·0 cites·20 claims
- 1044US8377776B2Method of fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2011·Granted Feb 19, 2013·0 cites·20 claims
- 1143USD1078858SMagnetic blockHUANG HAN·Filed 2025·Granted Jun 10, 2025·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →