Inventor · disambiguated record
Hanbing Wu
Also filed as: WU HANBING
17 granted patents·1 pending application·9 citations·filing 2013–2024
87Inventor score
Top patents by PatentIndex Score
18 records- 0186US10249522B2In-situ temperature measurement in a noisy environmentAPPLIED MATERIALS INC·Filed 2017·Granted Apr 2, 2019·3 cites·12 claims
- 0281US10573498B2Substrate processing apparatus including annular lamp assemblyAPPLIED MATERIALS INC·Filed 2017·Granted Feb 25, 2020·1 cites·10 claims
- 0378US9620339B2Sputter source for semiconductor process chambersAPPLIED MATERIALS INC·Filed 2013·Granted Apr 11, 2017·1 cites·8 claims
- 0477US11101117B2Methods and apparatus for co-sputtering multiple targetsAPPLIED MATERIALS INC·Filed 2019·Granted Aug 24, 2021·0 cites·20 claims
- 0576US11600476B2Deposition system with multi-cathode and method of manufacture thereofAPPLIED MATERIALS INC·Filed 2021·Granted Mar 7, 2023·0 cites·18 claims
- 0675US9673074B2In-situ temperature measurement in a noisy environmentAPPLIED MATERIALS INC·Filed 2014·Granted Jun 6, 2017·2 cites·15 claims
- 0772US11011357B2Methods and apparatus for multi-cathode substrate processingAPPLIED MATERIALS INC·Filed 2018·Granted May 18, 2021·1 cites·20 claims
- 0869US11043364B2Process kit for multi-cathode processing chamberAPPLIED MATERIALS INC·Filed 2017·Granted Jun 22, 2021·1 cites·20 claims
- 0963US2017211175A1Sputter source for semiconductor process chambersAPPLIED MATERIALS INC·Filed 2017·Application pending·0 cites
- 1061US10978276B2Substrate processing apparatus including top reflector above annular lamp assemblyAPPLIED MATERIALS INC·Filed 2020·Granted Apr 13, 2021·0 cites·15 claims
- 1156US10468238B2Methods and apparatus for co-sputtering multiple targetsAPPLIED MATERIALS INC·Filed 2016·Granted Nov 5, 2019·0 cites·20 claims
- 1255US12223839B1Testing method for blind spot detection system for automobile, device, and mediumCHINA AUTOMOTIVE TECH & RES CT·Filed 2024·Granted Feb 11, 2025·0 cites·7 claims
- 1352US12393699B1High-temporal-accuracy electromagnetic fault injection method and apparatus for cryptographic chipCHINA AUTOMOTIVE TECH & RES CT·Filed 2024·Granted Aug 19, 2025·0 cites·10 claims
- 1452US10704139B2Plasma chamber target for reducing defects in workpiece during dielectric sputteringAPPLIED MATERIALS INC·Filed 2017·Granted Jul 7, 2020·0 cites·17 claims
- 1550US11183375B2Deposition system with multi-cathode and method of manufacture thereofAPPLIED MATERIALS INC·Filed 2015·Granted Nov 23, 2021·0 cites·10 claims
- 1648US12224809B1OTA test method for vehicle antenna system, device, and storage mediumCHINA AUTOMOTIVE TECH & RES CT·Filed 2024·Granted Feb 11, 2025·0 cites·9 claims
- 1748US11459651B2Paste method to reduce defects in dielectric sputteringAPPLIED MATERIALS INC·Filed 2017·Granted Oct 4, 2022·0 cites·3 claims
- 1847US11802340B2UHV in-situ cryo-cool chamberAPPLIED MATERIALS INC·Filed 2017·Granted Oct 31, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →