Inventor · disambiguated record
Helen L. Maynard
Also filed as: MAYNARD HELEN · MAYNARD HELEN L · MAYNARD HELEN LOUISE
17 granted patents·7 pending applications·705 citations·filing 1995–2017
93Inventor score
Files withLUCENT TECHNOLOGIES INC5MAYNARD HELEN4IBM3PAPASOULIOTIS GEORGE D2VARIAN SEMICONDUCTOR EQUIPMENT ASS INC2
Top patents by PatentIndex Score
24 records- 0197US6255221B1Methods for running a high density plasma etcher to achieve reduced transistor device damageLAM RES CORP·Filed 1998·Granted Jul 3, 2001·369 cites·29 claims
- 0296US6541149B1Article comprising micro fuel cellLUCENT TECHNOLOGIES INC·Filed 2000·Granted Apr 1, 2003·100 cites·9 claims
- 0395US9123509B2Techniques for plasma processing a substratePAPASOULIOTIS GEORGE D·Filed 2011·Granted Sep 1, 2015·39 cites·19 claims
- 0483US5835221AProcess for fabricating a device using polarized light to determine film thicknessLUCENT TECHNOLOGIES INC·Filed 1996·Granted Nov 10, 1998·56 cites·10 claims
- 0582US5653894AActive neural network determination of endpoint in a plasma etch processLUCENT TECHNOLOGIES INC·Filed 1995·Granted Aug 5, 1997·80 cites·5 claims
- 0673US8679960B2Technique for processing a substrate having a non-planar surfacePAPASOULIOTIS GEORGE D·Filed 2010·Granted Mar 25, 2014·3 cites·21 claims
- 0769US8465909B2Self-aligned masking for solar cell manufactureBATEMAN NICHOLAS P T·Filed 2010·Granted Jun 18, 2013·2 cites·14 claims
- 0868US7279426B2Like integrated circuit devices with different depthIBM·Filed 2005·Granted Oct 9, 2007·3 cites·6 claims
- 0965US6228277B1Etch endpoint detectionLUCENT TECHNOLOGIES INC·Filed 1998·Granted May 8, 2001·32 cites·14 claims
- 1060US6750495B1Damascene capacitors for integrated circuitsAGERE SYSTEMS INC·Filed 1999·Granted Jun 15, 2004·19 cites·7 claims
- 1155US8124487B2Method for enhancing tensile stress and source/drain activation using Si:CMAYNARD HELEN L·Filed 2008·Granted Feb 28, 2012·2 cites·22 claims
- 1252US2009227061A1Establishing a high phosphorus concentration in solar cellsBATEMAN NICHOLAS·Filed 2009·Application pending·0 cites
- 1349US2010279479A1Formation Of Raised Source/Drain On A Strained Thin Film Implanted With Cold And/Or Molecular CarbonVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2009·Application pending·0 cites
- 1448US2007273004A1Like integrated circuit devices with different depthIBM·Filed 2007·Application pending·0 cites
- 1545US9093104B2Technique for manufacturing bit patterned mediaSINCLAIR FRANK·Filed 2012·Granted Jul 28, 2015·0 cites·16 claims
- 1645US2011039034A1Pulsed deposition and recrystallization and tandem solar cell design utilizing crystallized/amorphous materialMAYNARD HELEN·Filed 2009·Application pending·0 cites
- 1743US10460941B2Plasma doping using a solid dopant sourceVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2017·Granted Oct 29, 2019·0 cites·20 claims
- 1843US8431495B2Stencil mask profileMAYNARD HELEN·Filed 2010·Granted Apr 30, 2013·0 cites·6 claims
- 1942US9437432B1Self-compensating oxide layerVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2015·Granted Sep 6, 2016·0 cites·17 claims
- 2041US8698106B2Apparatus for detecting film delamination and a method thereofMAYNARD HELEN·Filed 2009·Granted Apr 15, 2014·0 cites·14 claims
- 2141US2007007244A1Detection of loss of plasma confinementIBM·Filed 2005·Application pending·0 cites
- 2239US2002029853A1Methods for running a high density plasma etcher to achieve reduced transistor device damageFiled 2001·Application pending·0 cites
- 2338US8877654B2Pulsed plasma to affect conformal processingMAYNARD HELEN·Filed 2010·Granted Nov 4, 2014·0 cites·12 claims
- 2430US2002004259A1Semicondctor device with multi-level interconnect having embedded loe dielectric constant layer and process for making sameLUCENT TECHNOLOGIES INC·Filed 1999·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →