Inventor · disambiguated record
Heiji Watanabe
Also filed as: WATANABE HEIJI
34 granted patents·2 pending applications·109 citations·filing 1982–2023
96Inventor score
Top patents by PatentIndex Score
36 records- 0198US11296223B2Semiconductor deviceROHM CO LTD·Filed 2021·Granted Apr 5, 2022·5 cites·29 claims
- 0297US11777030B2Semiconductor deviceROHM CO LTD·Filed 2022·Granted Oct 3, 2023·2 cites·29 claims
- 0397US9496393B2Semiconductor deviceROHM CO LTD·Filed 2016·Granted Nov 15, 2016·12 cites·11 claims
- 0496US9257521B2Semiconductor deviceROHM CO LTD·Filed 2015·Granted Feb 9, 2016·10 cites·13 claims
- 0595US10804392B2Semiconductor deviceROHM CO LTD·Filed 2019·Granted Oct 13, 2020·5 cites·19 claims
- 0695US10546954B2Semiconductor deviceROHM CO LTD·Filed 2019·Granted Jan 28, 2020·6 cites·13 claims
- 0794US8969877B2Semiconductor deviceROHM CO LTD·Filed 2014·Granted Mar 3, 2015·10 cites·11 claims
- 0893US8653533B2Semiconductor device and method of manufacturing the sameMITANI SHUHEI·Filed 2010·Granted Feb 18, 2014·12 cites·22 claims
- 0988US12439634B2Semiconductor deviceROHM CO LTD·Filed 2023·Granted Oct 7, 2025·0 cites·18 claims
- 1086US8088678B2Semiconductor manufacturing apparatus and methodKITANO NAOMU·Filed 2009·Granted Jan 3, 2012·15 cites·13 claims
- 1184US11342428B2Semiconductor devicePANASONIC CORP·Filed 2020·Granted May 24, 2022·2 cites·14 claims
- 1282US9293543B2Film forming method and film forming apparatusTOKYO ELECTRON LTD·Filed 2013·Granted Mar 22, 2016·5 cites·19 claims
- 1380US9893180B2Semiconductor deviceROHM CO LTD·Filed 2016·Granted Feb 13, 2018·1 cites·9 claims
- 1479US11610992B2Semiconductor deviceROHM CO LTD·Filed 2021·Granted Mar 21, 2023·0 cites·14 claims
- 1577US11043589B2Semiconductor deviceROHM CO LTD·Filed 2020·Granted Jun 22, 2021·0 cites·19 claims
- 1677US9397185B2Semiconductor deviceROHM CO LTD·Filed 2013·Granted Jul 19, 2016·4 cites·12 claims
- 1776US10833166B2Semiconductor device including an MIS structureROHM CO LTD·Filed 2017·Granted Nov 10, 2020·2 cites·15 claims
- 1868US10319853B2Semiconductor deviceROHM CO LTD·Filed 2018·Granted Jun 11, 2019·0 cites·13 claims
- 1958US4398123AHigh pressure discharge lampMITSUBISHI ELECTRIC CORP·Filed 1982·Granted Aug 9, 1983·8 cites·43 claims
- 2057US8026143B2Semiconductor element and manufacturing method thereofCANON ANELVA CORP·Filed 2007·Granted Sep 27, 2011·1 cites·7 claims
- 2152US10729398B2Radiation phase contrast imaging deviceSHIMADZU CORP·Filed 2017·Granted Aug 4, 2020·0 cites·7 claims
- 2252US7495264B2Semiconductor device with high dielectric constant insulating film and manufacturing method for the sameNEC CORP·Filed 2006·Granted Feb 24, 2009·0 cites·11 claims
- 2352US7151299B2Semiconductor device and its manufacturing methodNEC CORP·Filed 2003·Granted Dec 19, 2006·5 cites·65 claims
- 2449US7679148B2Semiconductor device, production method and production device thereofNEC CORP·Filed 2003·Granted Mar 16, 2010·4 cites·1 claims
- 2549US2009170300A1Semiconductor element and manufacturing method thereofCANON ANELVA CORP·Filed 2009·Application pending·0 cites
- 2648US10732132B2Radiation phase contrast imaging deviceSHIMADZU CORP·Filed 2017·Granted Aug 4, 2020·0 cites·11 claims
- 2748US10103232B2Semiconductor device and method for manufacturing semiconductor deviceUNIV OSAKA·Filed 2017·Granted Oct 16, 2018·0 cites·10 claims
- 2846US9368351B2Semiconductor device and method for manufacturing sameROHM CO LTD·Filed 2013·Granted Jun 14, 2016·0 cites·6 claims
- 2944US10772592B2X-ray phase contrast imaging apparatusSHIMADZU CORP·Filed 2017·Granted Sep 15, 2020·0 cites·6 claims
- 3044US9805944B2Method of manufacturing silicon carbide semiconductor deviceUNIV OSAKA·Filed 2017·Granted Oct 31, 2017·0 cites·5 claims
- 3142US8669624B2Semiconductor device and manufacturing method thereofKITANO NAOMU·Filed 2012·Granted Mar 11, 2014·0 cites·4 claims
- 3242US8575677B2Semiconductor device and its manufacturing methodWATANABE HEIJI·Filed 2012·Granted Nov 5, 2013·0 cites·9 claims
- 3342US2020158662A1X-ray Phase Contrast Imaging ApparatusSHIMADZU CORP·Filed 2017·Application pending·0 cites
- 3440US7164169B2Semiconductor device having high-permittivity insulation film and production method thereforNEC CORP·Filed 2002·Granted Jan 16, 2007·0 cites·30 claims
- 3536US10755920B2Method for manufacturing semiconductor device and semiconductor manufacturing apparatus used for the methodUNIV OSAKA·Filed 2016·Granted Aug 25, 2020·0 cites·13 claims
- 3634US8125016B2Semiconductor device and its manufacturing methodWATANABE HEIJI·Filed 2003·Granted Feb 28, 2012·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →