Inventor · disambiguated record
Hisatomi Hosaka
Also filed as: HOSAKA HISATOMI
13 granted patents·4 pending applications·130 citations·filing 1996–2013
92Inventor score
Files withTOKYO ELECTRON LTD10IBIDEN CO LTD2AMEMIYA TAKASHI1TAKEKOSHI KIYOSHI1TOKYO ELECTRON LIMTED1
Top patents by PatentIndex Score
17 records- 0191US7474110B2Probe cardTOKYO ELECTRON LTD·Filed 2007·Granted Jan 6, 2009·18 cites·12 claims
- 0286USRE42637EProbe cardTOKYO ELECTRON LTD·Filed 2010·Granted Aug 23, 2011·5 cites·27 claims
- 0386US7091733B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodIBIDEN CO LTD·Filed 2004·Granted Aug 15, 2006·30 cites·20 claims
- 0484US7498827B2Probe cardTOKYO ELECTRON LTD·Filed 2007·Granted Mar 3, 2009·10 cites·6 claims
- 0582US7242206B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodIBIDEN CO LTD·Filed 2005·Granted Jul 10, 2007·7 cites·43 claims
- 0681US7629806B2Method for forming connection pin, probe, connection pin, probe card and method for manufacturing probe cardTOKYO ELECTRON LTD·Filed 2006·Granted Dec 8, 2009·8 cites·7 claims
- 0778US7621045B2Method of producing a probe with a trapezoidal contactorTOKYO ELECTRON LTD·Filed 2007·Granted Nov 24, 2009·5 cites·1 claims
- 0875US7663386B2Probe cardTOKYO ELECTRON LTD·Filed 2005·Granted Feb 16, 2010·4 cites·8 claims
- 0968US7256592B2Probe with trapezoidal contractor and device based on application thereof, and method of producing themTOKYO ELECTRON LTD·Filed 2002·Granted Aug 14, 2007·10 cites·3 claims
- 1067US8456186B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodTAKEKOSHI KIYOSHI·Filed 2007·Granted Jun 4, 2013·2 cites·23 claims
- 1166US7750655B2Multilayer substrate and probe cardTOKYO ELECTRON LTD·Filed 2005·Granted Jul 6, 2010·2 cites·15 claims
- 1265US7541820B2Probe cardTOKYO ELECTRON LTD·Filed 2006·Granted Jun 2, 2009·2 cites·2 claims
- 1363US5798651AProbe systemTOKYO ELECTRON LTD·Filed 1996·Granted Aug 25, 1998·27 cites·17 claims
- 1446US2005156613A1Probe cardFiled 2005·Application pending·0 cites
- 1541US2013206460A1Circuit board for semiconductor device inspection apparatus and manufacturing method thereofTOKYO ELECTRON LIMTED·Filed 2013·Application pending·0 cites
- 1635US2001009376A1Probe arrangement assembly, method of manufacturing probe arrangement assembly, probe mounting method using probe arrangement assembly, and probe mounting apparatusFiled 2001·Application pending·0 cites
- 1734US2008048698A1Probe CardAMEMIYA TAKASHI·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →