Inventor · disambiguated record
Hiromu Inoue
Also filed as: INOUE HIROMU
37 granted patents·7 pending applications·275 citations·filing 1988–2025
97Inventor score
Files withNUFLARE TECHNOLOGY INC14TOSHIBA KK14HONDA MOTOR CO LTD3INOUE HIROMU3MITSUBISHI PETROCHEMICAL CO2
Top patents by PatentIndex Score
44 records- 0197US10572995B2Inspection method and inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2018·Granted Feb 25, 2020·13 cites·6 claims
- 0292US11385192B2Inspection apparatus and inspection methodNUFLARE TECHNOLOGY INC·Filed 2020·Granted Jul 12, 2022·2 cites·18 claims
- 0389US9036896B2Inspection system and method for inspecting line width and/or positional errors of a patternTOUYA TAKANAO·Filed 2011·Granted May 19, 2015·11 cites·10 claims
- 0487US9194817B2Defect detection methodNUFLARE TECHNOLOGY INC·Filed 2013·Granted Nov 24, 2015·6 cites·12 claims
- 0581US9406117B2Inspection system and method for inspecting line width and/or positional errors of a patternNUFLARE TECHNOLOGY INC·Filed 2015·Granted Aug 2, 2016·3 cites·6 claims
- 0681US9290971B2Door device for vehicleAMAGAI TOYOHISA·Filed 2012·Granted Mar 22, 2016·16 cites·7 claims
- 0780US11101103B2Multiple electron beam inspection apparatus and multiple electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2020·Granted Aug 24, 2021·1 cites·10 claims
- 0880US5574800APattern defect inspection method and apparatusTOSHIBA KK·Filed 1994·Granted Nov 12, 1996·58 cites·14 claims
- 0979US4921623ACopper conductive coating compositionMITSUBISHI PETROCHEMICAL CO·Filed 1988·Granted May 1, 1990·38 cites·8 claims
- 1078US10197507B2Inspection apparatusNUFLARE TECHNOLOGY INC·Filed 2014·Granted Feb 5, 2019·3 cites·9 claims
- 1177US6656648B2Pattern inspection apparatus, pattern inspection method and mask manufacturing methodTOSHIBA KK·Filed 2001·Granted Dec 2, 2003·15 cites·12 claims
- 1277US5204025AConductive paste compositionMITSUBISHI PETROCHEMICAL CO·Filed 1991·Granted Apr 20, 1993·29 cites·3 claims
- 1373US10984978B2Multiple electron beam inspection apparatus and multiple electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2019·Granted Apr 20, 2021·1 cites·15 claims
- 1472US7304730B2Inspection apparatus having two sensors, method for inspecting an object, and a method for manufacturing a photolithography maskTOSHIBA KK·Filed 2004·Granted Dec 4, 2007·8 cites·8 claims
- 1571US9207189B2Sample support apparatusNUFLARE TECHNOLOGY INC·Filed 2014·Granted Dec 8, 2015·1 cites·10 claims
- 1669US9764625B2Vehicle doorHONDA MOTOR CO LTD·Filed 2014·Granted Sep 19, 2017·3 cites·16 claims
- 1769US9557277B2Inspection apparatus and inspection methodNUFLARE TECHNOLOGY INC·Filed 2013·Granted Jan 31, 2017·1 cites·9 claims
- 1868US7466854B2Size checking method and apparatusTOSHIBA KK·Filed 2005·Granted Dec 16, 2008·8 cites·14 claims
- 1967US9645488B2Position measuring method, misplacement map generating method, and inspection systemNUFLARE TECHNOLOGY INC·Filed 2015·Granted May 9, 2017·1 cites·13 claims
- 2066US7394048B2Focusing device, focusing method and a pattern inspecting apparatusTOSHIBA KK·Filed 2007·Granted Jul 1, 2008·2 cites·6 claims
- 2166US6888958B1Method and apparatus for inspecting patternsTOSHIBA KK·Filed 2000·Granted May 3, 2005·15 cites·5 claims
- 2265US7070889B2Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2004·Granted Jul 4, 2006·6 cites·17 claims
- 2365US2024285875A1Atomizing apparatusMURATA MANUFACTURING CO·Filed 2024·Application pending·0 cites
- 2464US8761518B2Pattern inspection apparatusINOUE HIROMU·Filed 2011·Granted Jun 24, 2014·1 cites·5 claims
- 2564US7378201B2Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2006·Granted May 27, 2008·1 cites·34 claims
- 2663US9691143B2Inspection apparatus and inspection apparatus systemNUFLARE TECHNOLOGY INC·Filed 2013·Granted Jun 27, 2017·1 cites·7 claims
- 2760US12205272B2Pattern inspection device and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2022·Granted Jan 21, 2025·0 cites·22 claims
- 2860US6965687B2Size checking method and apparatusTOSHIBA KK·Filed 2001·Granted Nov 15, 2005·10 cites·5 claims
- 2959US9460502B2Defect inspection apparatus using images obtained by optical path adjustedTOSHIBA KK·Filed 2013·Granted Oct 4, 2016·1 cites·1 claims
- 3058US2025223537A1Culture device having time-lapse shooting function and culture methodASTEC CO LTD·Filed 2025·Application pending·0 cites
- 3158US2024046449A1Inspection apparatus, inspection method, and storage mediumTOSHIBA KK·Filed 2023·Application pending·0 cites
- 3256US6849363B2Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2001·Granted Feb 1, 2005·10 cites·34 claims
- 3356US4922166AElectron gun for multigun cathode ray tubeSONY CORP·Filed 1989·Granted May 1, 1990·10 cites·3 claims
- 3452US9116136B2Inspection method and systemNUFLARE TECHNOLOGY INC·Filed 2013·Granted Aug 25, 2015·0 cites·9 claims
- 3551US8358340B2Pattern inspection device and method of inspecting patternTOSHIBA KK·Filed 2009·Granted Jan 22, 2013·0 cites·11 claims
- 3651US2008030719A1Inspection apparatus having two sensors, method for inspecting an object, and a method for manufacturing a photolithography maskINOUE HIROMU·Filed 2007·Application pending·0 cites
- 3748US2023170183A1Multi-electron beam inspection device and multi-electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2021·Application pending·0 cites
- 3847US9539884B2Door sashHONDA MOTOR CO LTD·Filed 2014·Granted Jan 10, 2017·0 cites·16 claims
- 3943US2008055606A1Apparatus and method for inspecting a pattern and method for manufacturing a semiconductor deviceTOSHIBA KK·Filed 2007·Application pending·0 cites
- 4043US2005196059A1Image input apparatus and inspection apparatusFiled 2005·Application pending·0 cites
- 4141US10298000B2Door hole seal for automobileNISHIKAWA RUBBER CO LTD·Filed 2016·Granted May 21, 2019·0 cites·3 claims
- 4239US10232689B2Vehicular door structureHONDA MOTOR CO LTD·Filed 2015·Granted Mar 19, 2019·0 cites·11 claims
- 4332US9841385B2Pattern characteristic-detection apparatus for photomask and pattern characteristic-detection method for photomaskINOUE HIROMU·Filed 2010·Granted Dec 12, 2017·0 cites·5 claims
- 4421US4904310AMethod of generating a metal vapor in a metal vapor laserSHIKOKU RESEARCH INST INC·Filed 1988·Granted Feb 27, 1990·0 cites·4 claims
Join the waitlist — get patent alerts
Get an alert when Hiromu Inoue files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →