Inventor · disambiguated record
Hironobu Niijima
Also filed as: NIIJIMA HIRONOBU
9 granted patents·286 citations·filing 1986–1997
91Inventor score
Top patents by PatentIndex Score
9 records- 0192US4789945AMethod and apparatus for charged particle beam exposureADVANTEST CORP·Filed 1986·Granted Dec 6, 1988·62 cites·11 claims
- 0287US5757198AMethod and apparatus for detecting an IC defect using charged particle beamADVANTEST CORP·Filed 1996·Granted May 26, 1998·63 cites·9 claims
- 0381US4835535ADigital-to-analog converting apparatus equipped with calibrating functionNIPPON TELEGRAPH & TELEPHONE·Filed 1987·Granted May 30, 1989·38 cites·24 claims
- 0471US5592100AMethod for detecting an IC defect using charged particle beamADVANTEST CORP·Filed 1996·Granted Jan 7, 1997·28 cites·1 claims
- 0564US5640098AIC fault analysis system having charged particle beam testerADVANTEST CORP·Filed 1996·Granted Jun 17, 1997·27 cites·6 claims
- 0664US5521517AMethod and apparatus for detecting an IC defect using a charged particle beamADVANTEST CORP·Filed 1995·Granted May 28, 1996·27 cites·10 claims
- 0760US5821761AApparatus detecting an IC defect by comparing electron emissions from two integrated circuitsADVANTEST CORP·Filed 1997·Granted Oct 13, 1998·19 cites·2 claims
- 0850US5825191AIC fault location tracing apparatus and methodADVANTEST CORP·Filed 1996·Granted Oct 20, 1998·16 cites·10 claims
- 0929US5892779AScan test apparatusADVANTEST CORP·Filed 1996·Granted Apr 6, 1999·6 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →