Inventor · disambiguated record
Hong-Sok Choi
Also filed as: CHOI HONG S · CHOI HONG-SOK
18 granted patents·3 pending applications·119 citations·filing 1994–2012
92Inventor score
Files withHYNIX SEMICONDUCTOR INC10CHOI HONG-SOK7GOLD STAR ELECTRONICS1LG SEMICON CO LTD1LIM KYU NAM1
Top patents by PatentIndex Score
21 records- 0188US7898317B2Circuit for generating negative voltage and a semiconductor memory apparatus using the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Mar 1, 2011·21 cites·22 claims
- 0280US6912169B2Synchronous semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Jun 28, 2005·29 cites·9 claims
- 0377US6060930ADelay circuitLG SEMICON CO LTD·Filed 1998·Granted May 9, 2000·32 cites·20 claims
- 0474US8300485B2Sense amplifier and semiconductor apparatus including the sameLIM KYU NAM·Filed 2010·Granted Oct 30, 2012·6 cites·35 claims
- 0559US9310430B2Semiconductor integrated circuit and test control method thereofCHOI HONG-SOK·Filed 2012·Granted Apr 12, 2016·1 cites·17 claims
- 0659US6791897B2Word line driving circuitHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Sep 14, 2004·11 cites·7 claims
- 0758US5495189ANon-overlap signal generation circuitGOLD STAR ELECTRONICS·Filed 1994·Granted Feb 27, 1996·14 cites·9 claims
- 0854US7956650B2Input circuit of semiconductor integrated circuitHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Jun 7, 2011·1 cites·15 claims
- 0953US7705634B2Input circuit of semiconductor integrated circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 27, 2010·2 cites·16 claims
- 1048US8786302B2Test circuit for use in a semiconductor apparatusCHOI HONG-SOK·Filed 2011·Granted Jul 22, 2014·0 cites·5 claims
- 1146US7960994B2Test circuit for use in a semiconductor apparatusHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jun 14, 2011·0 cites·8 claims
- 1246US7656729B2Circuit and method for decoding column addresses in semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Feb 2, 2010·1 cites·21 claims
- 1346US2010244882A1Burn-In Test Method and SystemCHOI HONG-SOK·Filed 2009·Application pending·0 cites
- 1445US7525859B2Sense amplifier of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 28, 2009·1 cites·8 claims
- 1539US8102722B2Data output device for semiconductor memory apparatusCHOI HONG-SOK·Filed 2009·Granted Jan 24, 2012·0 cites·20 claims
- 1639US7904742B2Local skew detecting circuit for semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 8, 2011·0 cites·16 claims
- 1738US9036403B2Semiconductor memory devicesSK HYNIX INC·Filed 2012·Granted May 19, 2015·0 cites·14 claims
- 1838US7676711B2Test circuit for testing command signal at package level in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 9, 2010·0 cites·15 claims
- 1935US8627134B2Semiconductor apparatus and local skew detecting circuit thereforCHOI HONG-SOK·Filed 2011·Granted Jan 7, 2014·0 cites·19 claims
- 2032US2012126874A1Integrated circuitCHOI HONG-SOK·Filed 2010·Application pending·0 cites
- 2130US2012002491A1Test signal generating device, semiconductor memory apparatus using the same and multi-bit test method thereofCHOI HONG SOK·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →