Inventor · disambiguated record
Hong Qiu
Also filed as: QIU HONG
28 granted patents·3 pending applications·802 citations·filing 1996–2024
96Inventor score
Top patents by PatentIndex Score
31 records- 0198US6142615AInk-jet recording head with piezoelectric device and method for manufacturing the sameSEIKO EPSON CORP·Filed 1998·Granted Nov 7, 2000·399 cites·22 claims
- 0292US6294860B1Thin piezoelectric film element, process for the preparation thereof and ink jet recording head using thin piezoelectric film elementSEIKO EPSON CORP·Filed 1999·Granted Sep 25, 2001·59 cites·19 claims
- 0392US6097133AThin piezoelectric film element, process for the preparation thereof and ink jet recording head using thin piezoelectric film elementSEIKO EPSON CORP·Filed 1996·Granted Aug 1, 2000·68 cites·12 claims
- 0491US6419849B1Method for manufacturing piezoelectric materialSEIKO EPSON CORP·Filed 2000·Granted Jul 16, 2002·37 cites·16 claims
- 0589US6387225B1Thin piezoelectric film element, process for the preparation thereof and ink jet recording head using thin piezoelectric film elementSEIKO EPSON CORP·Filed 1998·Granted May 14, 2002·50 cites·3 claims
- 0687US6419848B1Piezoelectric actuator, ink-jet type recording head, manufacturing method therefor, and ink-jet printerSEIKO EPSON CORP·Filed 2000·Granted Jul 16, 2002·31 cites·23 claims
- 0778US7783669B2Data flow management in generating profile models used in optical metrologyTOKYO ELECTRON LTD·Filed 2006·Granted Aug 24, 2010·11 cites·17 claims
- 0878US6639340B1Method for manufacturing piezoelectric element, and piezoelectric element, ink-jet recording head and printerSEIK EPSON CORP·Filed 2000·Granted Oct 28, 2003·25 cites·11 claims
- 0976US6411017B1Piezoelectric device, ink jet recording head, and methods of manufacturing said device and headSEIKO EPSON CORP·Filed 1999·Granted Jun 25, 2002·33 cites·8 claims
- 1075US10393647B1System, method, and computer program product for automatically determining a parameter causing an abnormal semiconductor metrology measurementKLA TENCOR CORP·Filed 2014·Granted Aug 27, 2019·4 cites·17 claims
- 1175US10190868B2Metrology system, method, and computer program product employing automatic transitioning between utilizing a library and utilizing regression for measurement processingKLA TENCOR CORP·Filed 2015·Granted Jan 29, 2019·2 cites·11 claims
- 1272US11029367B2Method for identifying fault types of high voltage direct current transmission lineUNIV TIANJIN·Filed 2018·Granted Jun 8, 2021·1 cites·2 claims
- 1371US6281617B1Piezoelectric luminous element, display device and method for manufacturing sameSEIKO EPSON CORP·Filed 1999·Granted Aug 28, 2001·23 cites·7 claims
- 1470US6571446B2Method for manufacturing piezoelectric luminous elementSEIKO EPSON CORP·Filed 2001·Granted Jun 3, 2003·11 cites·7 claims
- 1570US6402304B1Piezoelectric actuator, ink jet printing head, printer, method for manufacturing piezoelectric actuator, and method for manufacturing ink jet printing headSEIKO EPSON CORP·Filed 1999·Granted Jun 11, 2002·27 cites·23 claims
- 1668US2024339124A1Cascade audio spotting systemSYNAPTICS INC·Filed 2024·Application pending·0 cites
- 1766US12254860B2Dynamic range compression combined with active noise cancellation to remove artifacts caused by transient noisesSYNAPTICS INC·Filed 2022·Granted Mar 18, 2025·0 cites·20 claims
- 1858US12057138B2Cascade audio spotting systemSYNAPTICS INC·Filed 2022·Granted Aug 6, 2024·0 cites·19 claims
- 1955US12382288B2Certificate based application descriptors for network slice selectionQUALCOMM INC·Filed 2020·Granted Aug 5, 2025·0 cites·25 claims
- 2054US12406041B2System and method for capturing notes on a mobile deviceQUALCOMM INC·Filed 2020·Granted Sep 2, 2025·0 cites·27 claims
- 2153US2025266028A1Recursive training of adaptive filters for active noise control (anc) systemsSYNAPTICS INC·Filed 2024·Application pending·0 cites
- 2246US7765234B2Data flow management in generating different signal formats used in optical metrologyTOKYO ELECTRON LTD·Filed 2006·Granted Jul 27, 2010·0 cites·26 claims
- 2346US2008013107A1Generating a profile model to characterize a structure to be examined using optical metrologyTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 2445US6803702B2Piezoelectric element and method of manufacturing sameSEIKO EPSON CORP·Filed 2002·Granted Oct 12, 2004·2 cites·6 claims
- 2545US6455106B1Method of forming oxide-ceramics filmSEIKO EPSON CORP·Filed 1999·Granted Sep 24, 2002·11 cites·4 claims
- 2644US8440238B2Sulfated derivative of Gastrodia elata polysaccharide, preparation method and antitumor use thereofDING KAN·Filed 2009·Granted May 14, 2013·0 cites·1 claims
- 2743US7765076B2Allocating processing units to processing clusters to generate simulated diffraction signalsTOKYO ELECTRON LTD·Filed 2006·Granted Jul 27, 2010·0 cites·21 claims
- 2843US7469192B2Parallel profile determination for an optical metrology systemTOKYO ELECTRON LTD·Filed 2006·Granted Dec 23, 2008·0 cites·29 claims
- 2941US6551652B2Process for producing a piezoelectric element using a first SOL and a second SOL having a lead content greater than the first SOLSEIKO EPSON CORP·Filed 1999·Granted Apr 22, 2003·8 cites·9 claims
- 3039US7515283B2Parallel profile determination in optical metrologyTOKYO ELECTRON LTD·Filed 2006·Granted Apr 7, 2009·0 cites·25 claims
- 3138US7742888B2Allocating processing units to generate simulated diffraction signals used in optical metrologyTOKYO ELECTRON LTD·Filed 2006·Granted Jun 22, 2010·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →