Inventor · disambiguated record
Hsin-Ming Hou
Also filed as: HOU HSIN-MING
13 granted patents·3 pending applications·24 citations·filing 2006–2022
86Inventor score
Top patents by PatentIndex Score
16 records- 0188US8434030B1Integrated circuit design and fabrication method by way of detecting and scoring hotspotsHOU HSIN-MING·Filed 2012·Granted Apr 30, 2013·16 cites·13 claims
- 0265US9958494B2Hierarchical wafer lifetime prediction methodUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 1, 2018·1 cites·12 claims
- 0364US9129076B2Hierarchical wafer yield prediction method and hierarchical lifetime prediction methodUNITED MICROELECTRONICS CORP·Filed 2013·Granted Sep 8, 2015·1 cites·11 claims
- 0463US7566647B2Method of disposing and arranging dummy patternsUNITED MICROELECTRONICS CORP·Filed 2006·Granted Jul 28, 2009·3 cites·20 claims
- 0561US9202914B2Semiconductor device and method for fabricating the sameHOU HSIN-MING·Filed 2012·Granted Dec 1, 2015·1 cites·11 claims
- 0659US8965550B2Experiments method for predicting wafer fabrication outcomeHOU HSIN-MING·Filed 2011·Granted Feb 24, 2015·1 cites·9 claims
- 0754US12484237B2Insulated gate bipolar transistorUNITED MICROELECTRONICS CORP·Filed 2022·Granted Nov 25, 2025·0 cites·16 claims
- 0854US8410571B2Layout of dummy patternsHOU HSIN-MING·Filed 2008·Granted Apr 2, 2013·1 cites·20 claims
- 0950US9443970B2Semiconductor device with epitaxial structures and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 13, 2016·0 cites·11 claims
- 1050US2022237450A1Semiconductor process prediction method and semiconductor process prediction apparatus considering overall features and local featuresUNITED MICROELECTRONICS CORP·Filed 2021·Application pending·0 cites
- 1150US2022237451A1Semiconductor process prediction method and semiconductor process prediction apparatus for heterogeneous dataUNITED MICROELECTRONICS CORP·Filed 2021·Application pending·0 cites
- 1249US8930865B1Layout correcting method and layout correcting systemUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jan 6, 2015·0 cites·18 claims
- 1344US9299624B2Stacked semiconductor structure and manufacturing method for the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Mar 29, 2016·0 cites·6 claims
- 1444US8643397B2Transistor array for testingHOU HSIN-MING·Filed 2011·Granted Feb 4, 2014·0 cites·11 claims
- 1540US9159809B2Multi-gate transistor deviceHOU HSIN-MING·Filed 2012·Granted Oct 13, 2015·0 cites·19 claims
- 1636US2013061188A1Hierarchical Wafer Yield Predicting Method and Hierarchical Lifetime Predicting MethodHOU HSIN-MING·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →