Inventor · disambiguated record
Hucheng Lee
Also filed as: LEE HUCHENG
25 granted patents·3 pending applications·44 citations·filing 2012–2024
93Inventor score
Top patents by PatentIndex Score
28 records- 0188US11416982B2Controlling a process for inspection of a specimenKLA CORP·Filed 2020·Granted Aug 16, 2022·2 cites·20 claims
- 0287US10395358B2High sensitivity repeater defect detectionKLA TENCOR CORP·Filed 2017·Granted Aug 27, 2019·7 cites·35 claims
- 0387US10151706B1Inspection for specimens with extensive die to die process variationKLA TENCOR CORP·Filed 2017·Granted Dec 11, 2018·5 cites·20 claims
- 0485US10557802B2Capture of repeater defects on a semiconductor waferKLA TENCOR CORP·Filed 2018·Granted Feb 11, 2020·2 cites·20 claims
- 0584US11244442B2Method and system for correlating optical images with scanning electron microscopy imagesKLA TENCOR CORP·Filed 2019·Granted Feb 8, 2022·3 cites·24 claims
- 0682US11010885B2Optical-mode selection for multi-mode semiconductor inspectionKLA TENCOR CORP·Filed 2019·Granted May 18, 2021·5 cites·14 claims
- 0780US10393671B2Intra-die defect detectionKLA TENCOR CORP·Filed 2016·Granted Aug 27, 2019·2 cites·22 claims
- 0880US9727047B2Defect detection using structural informationKLA TENCOR CORP·Filed 2015·Granted Aug 8, 2017·3 cites·18 claims
- 0979US11308606B2Design-assisted inspection for DRAM and 3D NAND devicesKLA CORP·Filed 2019·Granted Apr 19, 2022·2 cites·8 claims
- 1078US10923317B2Detecting defects in a logic region on a waferKLA CORP·Filed 2019·Granted Feb 16, 2021·2 cites·21 claims
- 1177US10395359B2Adaptive local threshold and color filteringKLA TENCOR CORP·Filed 2017·Granted Aug 27, 2019·2 cites·23 claims
- 1275US10410338B2Method and system for correlating optical images with scanning electron microscopy imagesKLA TENCOR CORP·Filed 2014·Granted Sep 10, 2019·2 cites·28 claims
- 1371US11783470B2Design-assisted inspection for DRAM and 3D NAND devicesKLA CORP·Filed 2022·Granted Oct 10, 2023·0 cites·18 claims
- 1470US9704234B2Adaptive local threshold and color filteringKLA TENCOR CORP·Filed 2014·Granted Jul 11, 2017·2 cites·35 claims
- 1569US10599944B2Visual feedback for inspection algorithms and filtersKLA TENCOR CORP·Filed 2012·Granted Mar 24, 2020·2 cites·25 claims
- 1667US10211025B2Determining a position of a defect in an electron beam imageKLA TENCOR CORP·Filed 2016·Granted Feb 19, 2019·2 cites·20 claims
- 1765US2025191171A1System and method of finding pixel-to-design target for dram inspectionKLA CORP·Filed 2023·Application pending·0 cites
- 1864US12444155B2Robust image-to-design alignment for dramKLA CORP·Filed 2023·Granted Oct 14, 2025·0 cites·20 claims
- 1962US10304177B2Systems and methods of using z-layer context in logic and hot spot inspection for sensitivity improvement and nuisance suppressionKLA TENCOR CORP·Filed 2017·Granted May 28, 2019·1 cites·18 claims
- 2060US2025245815A1Adaptive and robust detection of large defects and image misalignmentKLA CORP·Filed 2024·Application pending·0 cites
- 2155US12190498B2Print check repeater defect detectionKLA CORP·Filed 2022·Granted Jan 7, 2025·0 cites·30 claims
- 2253US11615993B2Clustering sub-care areas based on noise characteristicsKLA CORP·Filed 2020·Granted Mar 28, 2023·0 cites·19 claims
- 2351US12056867B2Image contrast metrics for deriving and improving imaging conditionsKLA CORP·Filed 2021·Granted Aug 6, 2024·0 cites·15 claims
- 2447US11619592B2Selecting defect detection methods for inspection of a specimenKLA CORP·Filed 2020·Granted Apr 4, 2023·0 cites·23 claims
- 2546US11049745B2Defect-location determination using correction loop for pixel alignmentKLA TENCOR CORP·Filed 2019·Granted Jun 29, 2021·0 cites·16 claims
- 2645US2024221141A1Pattern segmentation for nuisance suppressionKLA CORP·Filed 2022·Application pending·0 cites
- 2738US10339262B2System and method for defining care areas in repeating structures of design dataKLA TENCOR CORP·Filed 2016·Granted Jul 2, 2019·0 cites·20 claims
- 2837US10514685B2Automatic recipe stability monitoring and reportingKLA TENCOR CORP·Filed 2015·Granted Dec 24, 2019·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →