Inventor · disambiguated record
Huyen Tran
Also filed as: TRAN HUYEN · TRAN HUYEN T · TRAN HUYEN TRANG
6 granted patents·10 pending applications·795 citations·filing 1998–2025
88Inventor score
Top patents by PatentIndex Score
16 records- 0196US6638810B2Tantalum nitride CVD deposition by tantalum oxide densificationAPPLIED MATERIALS INC·Filed 2001·Granted Oct 28, 2003·324 cites·46 claims
- 0296US6204203B1Post deposition treatment of dielectric films for interface controlAPPLIED MATERIALS INC·Filed 1998·Granted Mar 20, 2001·271 cites·16 claims
- 0394US6319766B1Method of tantalum nitride deposition by tantalum oxide densificationAPPLIED MATERIALS INC·Filed 2000·Granted Nov 20, 2001·91 cites·23 claims
- 0486US6274058B1Remote plasma cleaning method for processing chambersAPPLIED MATERIALS INC·Filed 1999·Granted Aug 14, 2001·106 cites·21 claims
- 0575US2025375853A1Slurry-based temperature control for cmpAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0674US2022281070A1Slurry-based temperature control for cmpAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 0774US2022281061A1Temperature control with intra-layer transition during cmpAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 0873US10589397B2Endpoint control of multiple substrate zones of varying thickness in chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2017·Granted Mar 17, 2020·1 cites·16 claims
- 0971US8694144B2Endpoint control of multiple substrates of varying thickness on the same platen in chemical mechanical polishingDUBOUST ALAIN·Filed 2010·Granted Apr 8, 2014·2 cites·13 claims
- 1068US2025114901A1Grooves for edge and hot spot compensation in chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1168US2025114898A1Retaining ring for edge compensation by slurry flow controlAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1268US2025114897A1Edge and hot spot compensation techniques in chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1358US2025225368A1Process control based on simultaneous machine learning of spatial and temporal relations of time series dataIBM·Filed 2024·Application pending·0 cites
- 1457US2024256915A1Time series forecasting using multivariate time series data with missing valuesIBM·Filed 2023·Application pending·0 cites
- 1555US2014222188A1Endpoint control of multiple substrates of varying thickness on the same platen in chemical mechanical polishingAPPLIED MATERIALS INC·Filed 2014·Application pending·0 cites
- 1643US2014030956A1Control of polishing of multiple substrates on the same platen in chemical mechanical polishingZHANG JIMIN·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →