Inventor · disambiguated record
Ido Dolev
Also filed as: DOLEV IDO
11 granted patents·3 pending applications·15 citations·filing 2009–2024
83Inventor score
Top patents by PatentIndex Score
14 records- 0192US9535014B1Systems and methods for inspecting an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jan 3, 2017·8 cites·15 claims
- 0273US10481101B2Asymmetrical magnification inspection system and illumination moduleAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Nov 19, 2019·2 cites·14 claims
- 0368US9354212B2Inspection having a segmented pupilAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted May 31, 2016·1 cites·22 claims
- 0466US2024337606A1Parallel scanning overlay metrology with optical meta-surfacesKLA CORP·Filed 2024·Application pending·0 cites
- 0564US11226566B2Method of measuring misregistration of semiconductor devicesKLA TENCOR CORP·Filed 2021·Granted Jan 18, 2022·0 cites·16 claims
- 0663US8724882B2Mapping variations of a surfaceMESHULACH DORON·Filed 2009·Granted May 13, 2014·2 cites·23 claims
- 0762US2025138435A1Massive measurement sampling using multiple chucks and optical columnsKLA CORP·Filed 2023·Application pending·0 cites
- 0858US11967535B2On-product overlay targetsKLA CORP·Filed 2021·Granted Apr 23, 2024·0 cites·26 claims
- 0955US10928739B2Method of measuring misregistration of semiconductor devicesKLA TENCOR CORP·Filed 2019·Granted Feb 23, 2021·0 cites·14 claims
- 1052US11713959B2Overlay metrology using spectroscopic phaseKLA CORP·Filed 2021·Granted Aug 1, 2023·0 cites·37 claims
- 1152US8228601B2Scanning microscopy using inhomogeneous polarizationMESHULACH DORON·Filed 2009·Granted Jul 24, 2012·2 cites·22 claims
- 1246US2023068016A1Systems and methods for rotational calibration of metrology toolsKLA CORP·Filed 2021·Application pending·0 cites
- 1336US9846128B2Inspection system and a method for evaluating an exit pupil of an inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Dec 19, 2017·0 cites·15 claims
- 1434US11029253B2Computerized method for configuring an inspection system, computer program product and an inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jun 8, 2021·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →