Inventor · disambiguated record
James P. Mcniven
Also filed as: MCNIVEN JAMES P · MCNIVEN JAMES PETER
10 granted patents·48 citations·filing 2005–2016
90Inventor score
Technology areasG01N
Top patents by PatentIndex Score
10 records- 0196US7417722B2System and method for controlling light scattered from a workpiece surface in a surface inspection systemKLA TENCOR TECH CORP·Filed 2005·Granted Aug 26, 2008·26 cites·20 claims
- 0291US10018572B2Front quartersphere scattered light analysisKLA TENCOR CORP·Filed 2016·Granted Jul 10, 2018·2 cites·9 claims
- 0389US9488591B2Front quartersphere scattered light analysisKLA TENCOR CORP·Filed 2014·Granted Nov 8, 2016·3 cites·8 claims
- 0489US7605913B2System and method for inspecting a workpiece surface by analyzing scattered light in a front quartersphere region above the workpieceKLA TENCOR CORP·Filed 2005·Granted Oct 20, 2009·7 cites·33 claims
- 0585US9103800B2System with multiple scattered light collectorsKLA TENCOR CORP·Filed 2013·Granted Aug 11, 2015·2 cites·12 claims
- 0682US9528942B2Front quartersphere scattered light analysisKLA TENCOR CORP·Filed 2014·Granted Dec 27, 2016·1 cites·18 claims
- 0778US7659974B2System and method for controlling light scattered from a workpiece surface in a surface inspection systemKLA TENCOR CORP·Filed 2008·Granted Feb 9, 2010·2 cites·18 claims
- 0877US9110033B2Front quartersphere scattered light analysisBILLS RICHARD E·Filed 2009·Granted Aug 18, 2015·2 cites·17 claims
- 0977US8330947B2Back quartersphere scattered light analysisBILLS RICHARD EARL·Filed 2009·Granted Dec 11, 2012·2 cites·24 claims
- 1071US8497984B2System and method for inspection of a workpiece surface using multiple scattered light collectorsBILLS RICHARD EARL·Filed 2005·Granted Jul 30, 2013·1 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →