Inventor · disambiguated record
James Shen
Also filed as: SHEN JAMES · SHEN JAMES J · SHEN JAMES ZHIJIAN
9 granted patents·4 pending applications·348 citations·filing 1996–2018
91Inventor score
Top patents by PatentIndex Score
13 records- 0190US6328634B1Method of polishingRODEL INC·Filed 2000·Granted Dec 11, 2001·70 cites·12 claims
- 0288US6607424B1Compositions for insulator and metal CMP and methods relating theretoRODEL INC·Filed 2000·Granted Aug 19, 2003·47 cites·16 claims
- 0385US6443812B1Compositions for insulator and metal CMP and methods relating theretoRODEL INC·Filed 2000·Granted Sep 3, 2002·35 cites·7 claims
- 0484US5860848APolishing silicon wafers with improved polishing slurriesRODEL INC·Filed 1996·Granted Jan 19, 1999·99 cites·27 claims
- 0580US10507090B2Dental all-ceramic restoration and manufacturing method thereofHANGZHOU ERRAN TECH CO LTD·Filed 2015·Granted Dec 17, 2019·2 cites·10 claims
- 0679US6419553B2Methods for break-in and conditioning a fixed abrasive polishing padRODEL INC·Filed 2001·Granted Jul 16, 2002·19 cites·2 claims
- 0777US6524168B2Composition and method for polishing semiconductorsRODEL INC·Filed 2001·Granted Feb 25, 2003·24 cites·10 claims
- 0877US6074546AMethod for photoelectrochemical polishing of silicon wafersRODEL INC·Filed 1997·Granted Jun 13, 2000·46 cites·4 claims
- 0960US6319370B1Apparatus for photoelectrochemical polishing of silicon wafersRODEL INC·Filed 2000·Granted Nov 20, 2001·6 cites·1 claims
- 1045US2004241867A1Method of analyzing a wafer for metal impuritiesFiled 2004·Application pending·0 cites
- 1145US2004092029A1Method of preparing a silicon sample for analysisFiled 2003·Application pending·0 cites
- 1244US2021137655A1Bioactive Zirconia DentureHANGZHOU ERRAN TECH CO LTD·Filed 2018·Application pending·0 cites
- 1336US2002173235A1Methods for break-in and conditioning a fixed abrasive polishing padFiled 2002·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when James Shen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →