Inventor · disambiguated record
Jean Jimenez
Also filed as: JIMENEZ JEAN
33 granted patents·4 pending applications·235 citations·filing 1992–2020
96Inventor score
Files withST MICROELECTRONICS SA13SGS THOMSON MICROELECTRONICS9GALY PHILIPPE4ST MICROELECTRONICS CROLLES 2 SAS4ST MICROELECTRONICS INT NV3
Top patents by PatentIndex Score
37 records- 0193US9401351B2Electronic device for ESD protectionST MICROELECTRONICS SA·Filed 2015·Granted Jul 26, 2016·12 cites·20 claims
- 0291US9019666B2Electronic device, in particular for protection against electrostatic discharges, and method for protecting a component against electrostatic dischargesBOURGEAT JOHAN·Filed 2011·Granted Apr 28, 2015·24 cites·39 claims
- 0382US9997512B2Electronic device for ESD protectionST MICROELECTRONICS SA·Filed 2016·Granted Jun 12, 2018·3 cites·20 claims
- 0479US9159413B2Thermo programmable resistor based ROMLE NEEL OLIVIER·Filed 2010·Granted Oct 13, 2015·5 cites·10 claims
- 0577US6153453AJFET transistor manufacturing methodST MICROELECTRONICS SA·Filed 1999·Granted Nov 28, 2000·39 cites·4 claims
- 0670US8907373B2Electronic device for protecting from electrostatic dischargeST MICROELECTRONICS SA·Filed 2012·Granted Dec 9, 2014·3 cites·15 claims
- 0770US5432368APad protection diode structureSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Jul 11, 1995·25 cites·23 claims
- 0869US9159402B2SRAM bitcell implemented in double gate technologyASTHANA VIVEK·Filed 2012·Granted Oct 13, 2015·5 cites·24 claims
- 0968US11063429B2Low leakage MOSFET supply clamp for electrostatic discharge (ESD) protectionST MICROELECTRONICS INT NV·Filed 2018·Granted Jul 13, 2021·1 cites·41 claims
- 1066US11444077B2Electronic device for ESD protectionST MICROELECTRONICS SA·Filed 2019·Granted Sep 13, 2022·0 cites·20 claims
- 1166US8829620B2Transistor with adjustable supply and/or threshold voltageGALY PHILIPPE·Filed 2012·Granted Sep 9, 2014·2 cites·23 claims
- 1265US8847275B2Electronic device for protection against electrostatic discharges, with a concentric structureST MICROELECTRONICS SA·Filed 2013·Granted Sep 30, 2014·2 cites·20 claims
- 1365US5567977APrecision integrated resistorSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Oct 22, 1996·21 cites·21 claims
- 1464US5515225AIntegrated circuit protected against electrostatic overvoltagesSGS THOMSON MICROELECTRONICS·Filed 1994·Granted May 7, 1996·24 cites·23 claims
- 1563US8610216B2Structure for protecting an integrated circuit against electrostatic dischargesGALY PHILIPPE·Filed 2010·Granted Dec 17, 2013·2 cites·24 claims
- 1661US11658479B2Low leakage MOSFET supply clamp for electrostatic discharge (ESD) protectionST MICROELECTRONICS INT NV·Filed 2020·Granted May 23, 2023·0 cites·25 claims
- 1758US10515946B2Electronic device for ESD protectionST MICROELECTRONICS SA·Filed 2018·Granted Dec 24, 2019·0 cites·22 claims
- 1857US5357126AMOS transistor with an integrated protection zener diodeSGS THOMSON MICROELECTRONICS·Filed 1992·Granted Oct 18, 1994·17 cites·37 claims
- 1956US2019296007A1Method for fabricating a jfet transistor within an integrated circuit and corresponding integrated circuitST MICROELECTRONICS CROLLES 2 SAS·Filed 2019·Application pending·0 cites
- 2055US9368611B2Integrated circuit comprising a MOS transistor having a sigmoid response and corresponding method of fabricationST MICROELECTRONICS CROLLES 2·Filed 2013·Granted Jun 14, 2016·1 cites·9 claims
- 2152US5801078AMethod for manufacturing diffused channel insulated gate effect transistorSGS THOMSON MICROELECTRONICS·Filed 1996·Granted Sep 1, 1998·14 cites·22 claims
- 2251US9455247B2High-performance device for protection from electrostatic dischargeST MICROELECTRONICS SA·Filed 2016·Granted Sep 27, 2016·0 cites·20 claims
- 2351US2018130788A1Electronic device, in particular for protection against overvoltagesST MICROELECTRONICS SA·Filed 2018·Application pending·0 cites
- 2450US10361188B2Method for fabricating a JFET transistor within an integrated circuit and corresponding integrated circuitST MICROELECTRONICS CROLLES 2 SAS·Filed 2016·Granted Jul 23, 2019·0 cites·9 claims
- 2549US5646433APad protection diode structureSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Jul 8, 1997·10 cites·9 claims
- 2648US9997907B2Device for protection against electrostatic dischargesST MICROELECTRONICS SA·Filed 2015·Granted Jun 12, 2018·0 cites·26 claims
- 2748US9899366B2Electronic device, in particular for protection against overvoltagesST MICROELECTRONICS SA·Filed 2016·Granted Feb 20, 2018·0 cites·18 claims
- 2848US9324703B2High-performance device for protection from electrostatic dischargeGALY PHILIPPE·Filed 2012·Granted Apr 26, 2016·0 cites·15 claims
- 2946US5422298AMethod of manufacturing a precision integrated resistorSGS THOMSON MICROELECTRONICS·Filed 1992·Granted Jun 6, 1995·9 cites·18 claims
- 3045US9230950B2Method for producing an electronic device by assembling semi-conducting blocks and corresponding deviceST MICROELECTRONICS SA·Filed 2013·Granted Jan 5, 2016·0 cites·13 claims
- 3145US5336920ABuried avalanche diode having laterally adjacent semiconductor layersSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Aug 9, 1994·10 cites·20 claims
- 3242US10944257B2Integrated silicon controlled rectifier (SCR) and a low leakage SCR supply clamp for electrostatic discharge (ESP) protectionST MICROELECTRONICS INT NV·Filed 2018·Granted Mar 9, 2021·0 cites·46 claims
- 3342US8786989B2Electronic device comprising a buffer and means for protecting against electrostatic dischargesGALY PHILIPPE·Filed 2011·Granted Jul 22, 2014·0 cites·33 claims
- 3439US9287254B2Electronic device and protection circuitST MICROELECTRONICS SA·Filed 2015·Granted Mar 15, 2016·0 cites·20 claims
- 3537US2018374983A1Method of manufacturing a spad cellST MICROELECTRONICS CROLLES 2 SAS·Filed 2018·Application pending·0 cites
- 3636US2017194350A1Low-noise mos transistors and corresponding circuitST MICROELECTRONICS CROLLES 2 SAS·Filed 2016·Application pending·0 cites
- 3734US5543358AMethod for forming thin and thick metal layersSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Aug 6, 1996·6 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →