Inventor · disambiguated record
Jih-Wen Chou
Also filed as: CHOU JIH W · CHOU JIH-WEN
63 granted patents·8 pending applications·1,618 citations·filing 1993–2024
99Inventor score
Files withUNITED MICROELECTRONICS CORP42POWERCHIP SEMICONDUCTOR MFG CORP8PROMOS TECHNOLOGIES INC7EMEMORY TECHNOLOGY INC3UNITED MICROELECTRICS CORP2
Top patents by PatentIndex Score
71 records- 0194US5950090AMethod for fabricating a metal-oxide semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 1998·Granted Sep 7, 1999·125 cites·20 claims
- 0292US6228730B1Method of fabricating field effect transistorUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 8, 2001·89 cites·17 claims
- 0391US5914519AAir-gap spacer of a metal-oxide-semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jun 22, 1999·80 cites·3 claims
- 0490US6787419B2Method of forming an embedded memory including forming three silicon or polysilicon layersEMEMORY TECHNOLOGY INC·Filed 2003·Granted Sep 7, 2004·50 cites·14 claims
- 0589US5904526AMethod of fabricating high density semiconductor read-only memory deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted May 18, 1999·56 cites·12 claims
- 0688US5843824ADiode-based semiconductor read-only memory device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 1997·Granted Dec 1, 1998·66 cites·12 claims
- 0787US6297082B1Method of fabricating a MOS transistor with local channel ion implantation regionsUNITED MICROELECTRONICS CORP·Filed 1999·Granted Oct 2, 2001·89 cites·11 claims
- 0887US6242763B1Low triggering voltage SOI silicon-control-rectifier (SCR) structureUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jun 5, 2001·74 cites·26 claims
- 0986US5907778AMethod of fabricating the high-density diode-based read-only memory deviceUNITED MICROELECTRONICS CORP·Filed 1997·Granted May 25, 1999·48 cites·13 claims
- 1086US5904540AMethod for manufacturing shallow trench isolationUNITED MICROELECTRONICS CORP·Filed 1997·Granted May 18, 1999·84 cites·25 claims
- 1184US6801456B1Method for programming, erasing and reading a flash memory cellEMEMORY TECHNOLOGY INC·Filed 2003·Granted Oct 5, 2004·35 cites·15 claims
- 1283US6365475B1Method of forming a MOS transistorUNITED MICROELECTRONICS CORP·Filed 2000·Granted Apr 2, 2002·34 cites·18 claims
- 1382US6190981B1Method for fabricating metal oxide semiconductorUNITED MICROELECTRONICS CORP·Filed 1999·Granted Feb 20, 2001·48 cites·18 claims
- 1477US6177336B1Method for fabricating a metal-oxide semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jan 23, 2001·40 cites·20 claims
- 1576US5770508AMethod of forming lightly doped drains in metalic oxide semiconductor componentsUNITED MICROELECTRONICS CORP·Filed 1997·Granted Jun 23, 1998·39 cites·18 claims
- 1676US5308780ASurface counter-doped N-LDD for high hot carrier reliabilityUNITED MICROELECTRONICS CORP·Filed 1993·Granted May 3, 1994·52 cites·19 claims
- 1773US7462545B2Semicondutor device and manufacturing method thereofPROMOS TECHNOLOGIES INC·Filed 2005·Granted Dec 9, 2008·5 cites·8 claims
- 1872US6025234AMethod for manufacturing thick gate oxide deviceUNITED MICROELECTRONICS CORP·Filed 1997·Granted Feb 15, 2000·32 cites·15 claims
- 1972US5786255AMethod of forming a metallic oxide semiconductorUNITED MIROELECTRONICS CORP·Filed 1997·Granted Jul 28, 1998·38 cites·9 claims
- 2071US6200840B1Method for producing PMOS devicesUNITED MICROELECTRONICS CORP·Filed 1999·Granted Mar 13, 2001·31 cites·24 claims
- 2171US6033958AMethod of fabricating dual voltage MOS transistorsUNITED MICROELECTRONICS CORP·Filed 1998·Granted Mar 7, 2000·30 cites·4 claims
- 2271US5565700ASurface counter doped N-LDD for high carrier reliabilityUNITED MICROELECTRONICS CORP·Filed 1995·Granted Oct 15, 1996·34 cites·11 claims
- 2370US7531438B2Method of fabricating a recess channel transistorPROMOS TECHNOLOGIES INC·Filed 2006·Granted May 12, 2009·5 cites·15 claims
- 2470US5972763AMethod of fabricating an air-gap spacer of a metal-oxide-semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Oct 26, 1999·25 cites·8 claims
- 2569US6174778B1Method of fabricating metal oxide semiconductorUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jan 16, 2001·34 cites·19 claims
- 2669US5891783AMethod of reducing fringe capacitanceUNITED SEMICONDUCTOR CORP·Filed 1997·Granted Apr 6, 1999·28 cites·14 claims
- 2767US6350656B1SEG combined with tilt side implant processUNITED MICROELECTRONICS CORP·Filed 2000·Granted Feb 26, 2002·13 cites·18 claims
- 2864US12396190B2GaN device with N2 pre-treatment and method of performing N2 pre-treatmentPOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2023·Granted Aug 19, 2025·0 cites·12 claims
- 2963US6156126AMethod for reducing or avoiding the formation of a silicon recess in SDE junction regionsUNITED MICROELECTRONICS CORP·Filed 2000·Granted Dec 5, 2000·8 cites·19 claims
- 3063US6008100AMetal-oxide semiconductor field effect transistor device fabrication processUNITED MICROELECTRONICS CORP·Filed 1998·Granted Dec 28, 1999·27 cites·24 claims
- 3162US7541241B2Method for fabricating memory cellPROMOS TECHNOLOGIES INC·Filed 2005·Granted Jun 2, 2009·2 cites·9 claims
- 3262US6451675B1Semiconductor device having varied dopant density regionsUNITED MICROELECTRONICS CORP·Filed 2000·Granted Sep 17, 2002·10 cites·6 claims
- 3362US6165857AMethod for forming a transistor with selective epitaxial growth filmUNITED MICOELECTRONICS CORP·Filed 1999·Granted Dec 26, 2000·22 cites·23 claims
- 3462US5864163AFabrication of buried channel devices with shallow junction depthUNITED MICROELECTRICS CORP·Filed 1996·Granted Jan 26, 1999·23 cites·19 claims
- 3562US5825069AHigh-density semiconductor read-only memory deviceUNITED MICROELTRONICS CORP·Filed 1997·Granted Oct 20, 1998·19 cites·11 claims
- 3661US7494865B2Fabrication method of metal oxide semiconductor transistorPROMOS TECHNOLOGIES INC·Filed 2006·Granted Feb 24, 2009·2 cites·10 claims
- 3761US6274450B1Method for implementing metal oxide semiconductor field effect transistorUNITED MICROELECTRONICS CORP·Filed 1999·Granted Aug 14, 2001·20 cites·18 claims
- 3861US6187645B1Method for manufacturing semiconductor device capable of preventing gate-to-drain capacitance and eliminating birds beak formationUNITED MICROELECTRONICS CORP·Filed 1999·Granted Feb 13, 2001·19 cites·10 claims
- 3960US6316321B1Method for forming MOSFETUNITED MICROELECTRONICS CORP·Filed 1999·Granted Nov 13, 2001·18 cites·12 claims
- 4059US12439645B2High electron mobility transistor device and manufacturing method thereofPOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2022·Granted Oct 7, 2025·0 cites·20 claims
- 4159US6294432B1Super halo implant combined with offset spacer processUNITED MICROELECTRONICS CORP·Filed 1999·Granted Sep 25, 2001·17 cites·15 claims
- 4259US6174791B1Method for a pre-amorphizationUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jan 16, 2001·18 cites·20 claims
- 4358US12389657B2High electron mobility transistor device and manufacturing method thereofPOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2023·Granted Aug 12, 2025·0 cites·20 claims
- 4457US2025220973A1High electron mobility transistor and method of manufacturing the samePOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2024·Application pending·0 cites
- 4556US12471350B2Semiconductor structure and method of forming the samePOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2022·Granted Nov 11, 2025·0 cites·10 claims
- 4655US6952369B2Method for operating a NAND-array memory module composed of P-type memory cellsEMEMORY TECHNOLOGY INC·Filed 2003·Granted Oct 4, 2005·7 cites·16 claims
- 4754US12402347B2High electron mobility transistor device and manufacturing method thereofPOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2022·Granted Aug 26, 2025·0 cites·14 claims
- 4853US5985725AMethod for manufacturing dual gate oxide layerUNITED MICROELECTRONICS CORP·Filed 1997·Granted Nov 16, 1999·18 cites·12 claims
- 4952US6025274AMethod of fabricating salicideUNITED MICROELECTRONICS CORP·Filed 1999·Granted Feb 15, 2000·12 cites·17 claims
- 5050US6211023B1Method for fabricating a metal-oxide semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 1998·Granted Apr 3, 2001·12 cites·20 claims
Showing the top 50 of 71 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Jih-Wen Chou files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →