Inventor · disambiguated record
John K. Frediani
Also filed as: FREDIANI JOHN · FREDIANI JOHN K
11 granted patents·98 citations·filing 1980–2019
89Inventor score
Top patents by PatentIndex Score
11 records- 0192US10161993B2Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA blockADVANTEST CORP·Filed 2013·Granted Dec 25, 2018·18 cites·25 claims
- 0287US9810729B2Tester with acceleration for packet building within a FPGA blockADVANTEST CORP·Filed 2013·Granted Nov 7, 2017·7 cites·20 claims
- 0378US7650547B2Apparatus for locating a defect in a scan chain while testing digital logicVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 19, 2010·9 cites·6 claims
- 0476US7865788B2Dynamic mask memory for serial scan testingVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Jan 4, 2011·8 cites·7 claims
- 0564US11041907B2Method and system for acquisition of test dataADVANTEST CORP·Filed 2019·Granted Jun 22, 2021·0 cites·17 claims
- 0657US4387424ACommunications systems for a word processing system employing distributed processing circuitryPITNEY BOWES INC·Filed 1980·Granted Jun 7, 1983·23 cites·12 claims
- 0756US10634723B2Method and system for acquisition of test dataADVANTEST CORP·Filed 2018·Granted Apr 28, 2020·0 cites·18 claims
- 0852US4398246AWord processing system employing a plurality of general purpose processor circuitsPITNEY BOWES INC·Filed 1980·Granted Aug 9, 1983·19 cites·13 claims
- 0940US4393377ACircuit for controlling information on a displayPITNEY BOWES INC·Filed 1980·Granted Jul 12, 1983·8 cites·14 claims
- 1036US8127186B2Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under testBURLISON PHILLIP D·Filed 2008·Granted Feb 28, 2012·0 cites·21 claims
- 1136US4422070ACircuit for controlling character attributes in a word processing system having a displayPITNEY BOWES INC·Filed 1980·Granted Dec 20, 1983·6 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →