Inventor · disambiguated record
John Gerling
Also filed as: GERLING JOHN · GERLING JOHN DAVID
10 granted patents·6 pending applications·14 citations·filing 2013–2025
82Inventor score
Top patents by PatentIndex Score
16 records- 0186US11699607B2Segmented multi-channel, backside illuminated, solid state detector with a through-hole for detecting secondary and backscattered electronsKLA CORP·Filed 2021·Granted Jul 11, 2023·1 cites·20 claims
- 0279US10354832B2Multi-column scanning electron microscopy systemKLA TENCOR CORP·Filed 2017·Granted Jul 16, 2019·3 cites·37 claims
- 0372US9390887B2Non-invasive charged particle beam monitorKLA TENCOR CORP·Filed 2014·Granted Jul 12, 2016·3 cites·21 claims
- 0471US9513230B2Apparatus and method for optical inspection, magnetic field and height mappingKLA TENCOR CORP·Filed 2013·Granted Dec 6, 2016·3 cites·22 claims
- 0571US9418819B2Asymmetrical detector design and methodologyKLA TENCOR CORP·Filed 2014·Granted Aug 16, 2016·2 cites·20 claims
- 0670US10438769B1Array-based characterization toolKLA TENCOR CORP·Filed 2018·Granted Oct 8, 2019·2 cites·47 claims
- 0766US2025385066A1High-voltage column with permanent magnet lens and positive wafer bias for overlayKLA CORP·Filed 2025·Application pending·0 cites
- 0864US2025316437A1Ultra-high sensitivity hybrid inspection with full wafer coverage capabilityKLA CORP·Filed 2024·Application pending·0 cites
- 0959US2021090844A1Multi-column scanning electron microscopy systemKLA CORP·Filed 2020·Application pending·0 cites
- 1055US2024014000A1Miniature electron optical column with a large field of viewKLA CORP·Filed 2022·Application pending·0 cites
- 1154US9779872B2Apparatus and method for fine-tuning magnet arrays with localized energy deliveryKLA TENCOR CORP·Filed 2014·Granted Oct 3, 2017·0 cites·20 claims
- 1254US2023326704A1Miniature hybrid electron beam columnKLA CORP·Filed 2022·Application pending·0 cites
- 1349US10840056B2Multi-column scanning electron microscopy systemKLA TENCOR CORP·Filed 2017·Granted Nov 17, 2020·0 cites·19 claims
- 1446US10211021B2Permanent-magnet particle beam apparatus and method incorporating a non-magnetic metal portion for tunabilityKLA TENCOR CORP·Filed 2017·Granted Feb 19, 2019·0 cites·18 claims
- 1544US2015076697A1Dummy barrier layer features for patterning of sparsely distributed metal features on the barrier with cmpKLA TENCOR CORP·Filed 2014·Application pending·0 cites
- 1641US11410830B1Defect inspection and review using transmissive current image of charged particle beam systemKLA TENCOR CORP·Filed 2019·Granted Aug 9, 2022·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →