Inventor · disambiguated record
John R. Goss
Also filed as: GOSS JOHN R · GOSS JOHN ROBERT
28 granted patents·90 citations·filing 1986–2023
95Inventor score
Top patents by PatentIndex Score
28 records- 0194US12266415B1Reliable electronic fuse based storage using error correction codingMARVELL ASIA PTE LTD·Filed 2023·Granted Apr 1, 2025·4 cites·18 claims
- 0288US9274171B1Customer-transparent logic redundancy for improved yieldIBM·Filed 2014·Granted Mar 1, 2016·5 cites·19 claims
- 0388US5006154AMethod of synchronizing flowering in plantsSHELL OIL CO·Filed 1986·Granted Apr 9, 1991·7 cites·27 claims
- 0487US9881694B2Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2015·Granted Jan 30, 2018·6 cites·20 claims
- 0586US7911820B2Regulating electrical fuse programming currentIBM·Filed 2008·Granted Mar 22, 2011·17 cites·20 claims
- 0685US9791507B2Customer-transparent logic redundancy for improved yieldIBM·Filed 2016·Granted Oct 17, 2017·2 cites·12 claims
- 0783US8095907B2Reliability evaluation and system fail warning methods using on chip parametric monitorsBICKFORD JEANNE P·Filed 2007·Granted Jan 10, 2012·9 cites·10 claims
- 0881US7560946B2Method of acceptance for semiconductor devicesIBM·Filed 2007·Granted Jul 14, 2009·10 cites·7 claims
- 0979US7656182B2Testing method using a scalable parametric measurement macroIBM·Filed 2007·Granted Feb 2, 2010·9 cites·34 claims
- 1079US7487477B2Parametric-based semiconductor designIBM·Filed 2006·Granted Feb 3, 2009·9 cites·9 claims
- 1176US9653330B1Threshold voltage (VT)-type transistor sensitive and/or fan-out sensitive selective voltage binningGLOBALFOUNDRIES INC·Filed 2016·Granted May 16, 2017·2 cites·20 claims
- 1276US8949767B2Reliability evaluation and system fail warning methods using on chip parametric monitorsMENTOR GRAPHICS CORP·Filed 2013·Granted Feb 3, 2015·2 cites·17 claims
- 1373US11293980B2Customer-transparent logic redundancy for improved yieldIBM·Filed 2020·Granted Apr 5, 2022·0 cites·20 claims
- 1469US10955474B2Customer-transparent logic redundancy for improved yieldIBM·Filed 2019·Granted Mar 23, 2021·0 cites·20 claims
- 1568US10971243B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 6, 2021·1 cites·20 claims
- 1667US8504975B2Reliability evaluation and system fail warning methods using on chip parametric monitorsBICKFORD JEANNE P·Filed 2012·Granted Aug 6, 2013·1 cites·27 claims
- 1766US10692584B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2017·Granted Jun 23, 2020·1 cites·16 claims
- 1862US10551436B2Customer-transparent logic redundancy for improved yieldIBM·Filed 2017·Granted Feb 4, 2020·0 cites·16 claims
- 1962US8963566B2Thermally adaptive in-system allocationIBM·Filed 2012·Granted Feb 24, 2015·1 cites·12 claims
- 2055US11295829B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 5, 2022·0 cites·19 claims
- 2154US8570820B2Selectable repair pass maskingGORMAN KEVIN WILLIAM·Filed 2011·Granted Oct 29, 2013·2 cites·20 claims
- 2250US10553302B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2017·Granted Feb 4, 2020·0 cites·20 claims
- 2348US7904839B2System and method for controlling access to addressable integrated circuitsIBM·Filed 2007·Granted Mar 8, 2011·0 cites·17 claims
- 2447US9760673B2Application specific integrated circuit (ASIC) test screens and selection of such screensGLOBALFOUNDRIES INC·Filed 2016·Granted Sep 12, 2017·0 cites·20 claims
- 2547US7831936B2Structure for a system for controlling access to addressable integrated circuitsIBM·Filed 2007·Granted Nov 9, 2010·0 cites·4 claims
- 2641US7145977B2Diagnostic method and apparatus for non-destructively observing latch dataIBM·Filed 2003·Granted Dec 5, 2006·2 cites·23 claims
- 2740US7916826B2Diagnostic method and apparatus for non-destructively observing latch dataIBM·Filed 2008·Granted Mar 29, 2011·0 cites·17 claims
- 2838US7453973B2Diagnostic method and apparatus for non-destructively observing latch dataIBM·Filed 2006·Granted Nov 18, 2008·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →