Inventor · disambiguated record
John Joseph Harsany
Also filed as: HARSANY JOHN J · HARSANY JOHN JOSEPH
3 granted patents·1 pending application·60 citations·filing 2003–2009
72Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0180US6876215B1Apparatus for testing semiconductor integrated circuit devices in wafer formCREDENCE SYSTEMS CORP·Filed 2003·Granted Apr 5, 2005·31 cites·13 claims
- 0276US7057410B1Interface structure for semiconductor integrated circuit test equipmentCREDENCE SYSTEMS CORP·Filed 2003·Granted Jun 6, 2006·24 cites·4 claims
- 0361US8424594B2Apparatus for thermal control in the analysis of electronic devicesCANFIELD DANIEL C·Filed 2007·Granted Apr 23, 2013·5 cites·17 claims
- 0436US2009146359A1Low profile clamp for use with apparatus for thermal control in the analysis of electronic devicesCANFIELD DANIEL C·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →