Inventor · disambiguated record
Jordan Pio
Also filed as: PIO JORDAN
1 granted patent·3 pending applications·13 citations·filing 2017–2023
38Inventor score
Top patents by PatentIndex Score
4 records- 0190US10527952B2Fault discrimination and calibration of scatterometry overlay targetsKLA TENCOR CORP·Filed 2017·Granted Jan 7, 2020·13 cites·26 claims
- 0272US2024337952A1System and method for determining overlay measurement of a scanning targetKLA CORP·Filed 2023·Application pending·0 cites
- 0358US2024302751A1Multi-overlay stacked grating metrology targetKLA CORP·Filed 2023·Application pending·0 cites
- 0450US2024093985A1System and method for acquiring alignment measurements of structures of a bonded sampleKLA CORP·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →