Inventor · disambiguated record
Jun Fujihara
Also filed as: FUJIHARA JUN
22 granted patents·26 citations·filing 2004–2021
90Inventor score
Top patents by PatentIndex Score
22 records- 0188US11249132B2Prober and method of preheating probe cardTOKYO ELECTRON LTD·Filed 2020·Granted Feb 15, 2022·2 cites·6 claims
- 0288US11199575B2Prober and probe card precooling methodTOKYO ELECTRON LTD·Filed 2020·Granted Dec 14, 2021·2 cites·7 claims
- 0383US9346358B2Vehicle control apparatusFUJITSU TEN LTD·Filed 2015·Granted May 24, 2016·5 cites·12 claims
- 0472US11099236B2Inspection device and contact methodTOKYO ELECTRON LTD·Filed 2018·Granted Aug 24, 2021·1 cites·18 claims
- 0563US11067624B2Inspection systemTOKYO ELECTRON LTD·Filed 2018·Granted Jul 20, 2021·1 cites·17 claims
- 0661US11307223B2Inspection device and method of controlling temperature of probe cardTOKYO ELECTRON LTD·Filed 2020·Granted Apr 19, 2022·0 cites·11 claims
- 0758US7119735B2Vehicle-installed radar sensor system and vehicle-installed radar sensorFUJITSU LTD·Filed 2004·Granted Oct 10, 2006·15 cites·8 claims
- 0857US11215640B2Prober and probe card cleaning methodTOKYO ELECTRON LTD·Filed 2020·Granted Jan 4, 2022·0 cites·5 claims
- 0956US10935570B2Intermediate connection member and inspection apparatusTOKYO ELECTRON LTD·Filed 2019·Granted Mar 2, 2021·0 cites·12 claims
- 1050US11761704B2Inspection apparatus and inspection methodTOKYO ELECTRON LTD·Filed 2021·Granted Sep 19, 2023·0 cites·6 claims
- 1150US11385283B2Chuck top, inspection apparatus, and chuck top recovery methodTOKYO ELECTRON LTD·Filed 2020·Granted Jul 12, 2022·0 cites·13 claims
- 1250US10901028B2Substrate inspection method and substrate inspection deviceTOKYO ELECTRON LTD·Filed 2017·Granted Jan 26, 2021·0 cites·8 claims
- 1349US11467208B2Contact release method in inspection apparatus and inspection apparatusTOKYO ELECTRON LTD·Filed 2021·Granted Oct 11, 2022·0 cites·11 claims
- 1447US12065182B2Trolley and method for supporting component of substrate processing apparatusTOKYO ELECTRON LTD·Filed 2021·Granted Aug 20, 2024·0 cites·15 claims
- 1547US11525859B2Insertion/extraction mechanism and method for replacing block memberTOKYO ELECTRON LTD·Filed 2019·Granted Dec 13, 2022·0 cites·17 claims
- 1647US11442096B2Testing apparatusTOKYO ELECTRON LTD·Filed 2021·Granted Sep 13, 2022·0 cites·10 claims
- 1747US11269004B2Inspection apparatus and inspection method for inspecting electrical characteristic of electronic deviceTOKYO ELECTRON LTD·Filed 2019·Granted Mar 8, 2022·0 cites·9 claims
- 1846US11169206B2Inspection apparatus, inspection system, and aligning methodTOKYO ELECTRON LTD·Filed 2018·Granted Nov 9, 2021·0 cites·12 claims
- 1946US10845409B2Substrate inspection deviceTOKYO ELECTRON LTD·Filed 2017·Granted Nov 24, 2020·0 cites·12 claims
- 2044US11092641B2Inspection apparatus and inspection methodTOKYO ELECTRON LTD·Filed 2019·Granted Aug 17, 2021·0 cites·6 claims
- 2140US11454664B2Testing systemTOKYO ELECTRON LTD·Filed 2018·Granted Sep 27, 2022·0 cites·20 claims
- 2239US11360115B2Inspection systemTOKYO ELECTRON LTD·Filed 2019·Granted Jun 14, 2022·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →