Inventor · disambiguated record
Karsten Stoll
Also filed as: STOLL KARSTEN
11 granted patents·1 pending application·55 citations·filing 2003–2017
88Inventor score
Files withCASCADE MICROTECH INC5SUSS MICROTEC TEST SYS GMBH2KANEV STOJAN1KIESEWETTER JOERG1RUMIANTSEV ANDREJ1
Top patents by PatentIndex Score
12 records- 0191US9784763B1Shielded probe systems with controlled testing environmentsCASCADE MICROTECH INC·Filed 2016·Granted Oct 10, 2017·10 cites·20 claims
- 0284US8497693B2Method for testing a test substrate under defined thermal conditions and thermally conditionable proberKIESEWETTER JOERG·Filed 2008·Granted Jul 30, 2013·12 cites·16 claims
- 0380US8240650B2Chuck with triaxial constructionTEICH MICHAEL·Filed 2008·Granted Aug 14, 2012·8 cites·16 claims
- 0472US8278951B2Probe station for testing semiconductor substrates and comprising EMI shieldingKANEV STOJAN·Filed 2007·Granted Oct 2, 2012·8 cites·12 claims
- 0567US7999563B2Chuck for supporting and retaining a test substrate and a calibration substrateCASCADE MICROTECH INC·Filed 2009·Granted Aug 16, 2011·5 cites·19 claims
- 0663US7652491B2Probe support with shield for the examination of test substrates under use of probe supportsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Jan 26, 2010·4 cites·12 claims
- 0757US10281492B2Shielded probe systems with controlled testing environmentsCASCADE MICROTECH INC·Filed 2017·Granted May 7, 2019·0 cites·20 claims
- 0855US7038441B2Test apparatus with loading deviceSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2003·Granted May 2, 2006·7 cites·20 claims
- 0954US9395411B2Method for testing a test substrate under defined thermal conditions and thermally conditionable proberCASCADE MICROTECH INC·Filed 2013·Granted Jul 19, 2016·0 cites·9 claims
- 1044US7265536B2Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe stationSUSS MICROTEC TEST SYS GMBH·Filed 2006·Granted Sep 4, 2007·1 cites·18 claims
- 1143US8680879B2Chuck for supporting and retaining a test substrate and a calibration substrateRUMIANTSEV ANDREJ·Filed 2011·Granted Mar 25, 2014·0 cites·23 claims
- 1243US2014184003A1Systems and methods for rotational alignment of a device under testCASCADE MICROTECH INC·Filed 2013·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Karsten Stoll files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →