Inventor · disambiguated record
Kazumi Yamagata
Also filed as: YAMAGATA KAZUMI
9 granted patents·238 citations·filing 1995–2021
87Inventor score
Files withTOKYO ELECTRON LTD9
Top patents by PatentIndex Score
9 records- 0192US6060892AProbe card attaching mechanismTOKYO ELECTRON LTD·Filed 1997·Granted May 9, 2000·124 cites·15 claims
- 0288US7701236B2Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a waferTOKYO ELECTRON LTD·Filed 2008·Granted Apr 20, 2010·16 cites·17 claims
- 0386US7944200B2Probe apparatusTOKYO ELECTRON LTD·Filed 2009·Granted May 17, 2011·13 cites·11 claims
- 0482US6118290AProber and method for cleaning probes provided thereinTOKYO ELECTRON LTD·Filed 1998·Granted Sep 12, 2000·52 cites·1 claims
- 0569US5640100AProbe apparatus having probe card exchanging mechanismTOKYO ELECTRON LTD·Filed 1995·Granted Jun 17, 1997·32 cites·22 claims
- 0652US11467099B2Inspection apparatusTOKYO ELECTRON LTD·Filed 2020·Granted Oct 11, 2022·0 cites·4 claims
- 0752US11385260B2Probe card holding device and inspection deviceTOKYO ELECTRON LTD·Filed 2021·Granted Jul 12, 2022·0 cites·7 claims
- 0851US11221350B2Probe device for improving transfer accuracy of needle traces of probes and needle trace transcription method thereforTOKYO ELECTRON LTD·Filed 2018·Granted Jan 11, 2022·0 cites·8 claims
- 0930USD383683SWafer proberTOKYO ELECTRON LTD·Filed 1996·Granted Sep 16, 1997·1 cites·1 claims
Join the waitlist — get patent alerts
Get an alert when Kazumi Yamagata files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →