USD383683SExpiredUtility

Wafer prober

30
Assignee: TOKYO ELECTRON LTDPriority: Apr 25, 1996Filed: Apr 25, 1996Granted: Sep 16, 1997
Est. expiryApr 25, 2016(expired)· nominal 20-yr term from priority
Inventors:Osamu KamataMasahiko SugiyamaMunetoshi NagasakaHaruhiko YoshiokaKazumi Yamagata
30
PatentIndex Score
1
Cited by
4
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for wafer prober, as shown.

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