Inventor · disambiguated record
Munetoshi Nagasaka
Also filed as: NAGASAKA MUNETOSHI
14 granted patents·704 citations·filing 1995–2014
92Inventor score
Top patents by PatentIndex Score
14 records- 0197USD609652SWafer attracting plateTOKYO ELECTRON LTD·Filed 2009·Granted Feb 9, 2010·567 cites·1 claims
- 0285USD589474SWafer holding memberTOKYO ELECTRON LTD·Filed 2007·Granted Mar 31, 2009·34 cites·1 claims
- 0384USD589912SWafer holding memberTOKYO ELECTRON LTD·Filed 2007·Granted Apr 7, 2009·32 cites·1 claims
- 0478US7541801B2Probe card transfer assist apparatus, and inspection equipment and method using sameTOKYO ELECTRON LTD·Filed 2006·Granted Jun 2, 2009·6 cites·23 claims
- 0573US5604443AProbe test apparatusTOKYO ELECTRON LTD·Filed 1995·Granted Feb 18, 1997·45 cites·19 claims
- 0672US8196983B2Substrate attracting device and substrate transfer apparatusNAGASAKA MUNETOSHI·Filed 2008·Granted Jun 12, 2012·6 cites·9 claims
- 0770US8082977B2Ceramic mounting for wafer apparatus with thermal expansion featureAKAIKE YUTAKA·Filed 2007·Granted Dec 27, 2011·5 cites·9 claims
- 0867US9638719B2Probe device having cleaning mechanism for cleaning connection conductorTOKYO ELECTRON LTD·Filed 2014·Granted May 2, 2017·2 cites·4 claims
- 0966US9759762B2Probe deviceTOKYO ELECTRON LTD·Filed 2014·Granted Sep 12, 2017·2 cites·14 claims
- 1059US7528620B2Probe card transfer assist apparatus and inspection equipment using sameTOKYO ELECTRON LTD·Filed 2006·Granted May 5, 2009·3 cites·26 claims
- 1143US9261553B2Probe apparatusTOKYO ELECTRON LTD·Filed 2014·Granted Feb 16, 2016·0 cites·14 claims
- 1242US9523711B2Probe apparatus and wafer mounting table for probe apparatusTOKYO ELECTRON LTD·Filed 2013·Granted Dec 20, 2016·0 cites·4 claims
- 1332USD612879SSemiconductor wafer inspection apparatusTOKYO ELECTRON LTD·Filed 2006·Granted Mar 30, 2010·1 cites·1 claims
- 1430USD383683SWafer proberTOKYO ELECTRON LTD·Filed 1996·Granted Sep 16, 1997·1 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →