Inventor · disambiguated record
Kenichi Fujisaki
Also filed as: FUJISAKI KENICHI
24 granted patents·7 pending applications·467 citations·filing 1988–2025
96Inventor score
Files withADVANTEST CORP15DAINIPPON INK & CHEMICALS10FUJISAKI KENICHI4ADVANTEST COPORATION1MOTOROLA INC1
Top patents by PatentIndex Score
31 records- 0186US10619942B2Heat storage molded body, heat storage laminate, and heat storage molded body production methodDAINIPPON INK & CHEMICALS·Filed 2017·Granted Apr 14, 2020·2 cites·11 claims
- 0283US5831989AMemory testing apparatusADVANTEST COPORATION·Filed 1997·Granted Nov 3, 1998·64 cites·7 claims
- 0382US10502499B2Heat storage molded body, heat storage laminate, and heat storage molded body production methodDAINIPPON INK & CHEMICALS·Filed 2017·Granted Dec 10, 2019·1 cites·9 claims
- 0482US6006349AHigh speed pattern generating method and high speed pattern generator using the methodADVANTEST CORP·Filed 1996·Granted Dec 21, 1999·52 cites·22 claims
- 0581US6173238B1Memory testing apparatusADVANTEST CORP·Filed 1997·Granted Jan 9, 2001·50 cites·5 claims
- 0680US7337381B2Memory tester having defect analysis memory with two storage sectionsADVANTEST CORP·Filed 2005·Granted Feb 26, 2008·10 cites·6 claims
- 0780US5410687AAnalyzing device for saving semiconductor memory failuresADVANTEST CORP·Filed 1993·Granted Apr 25, 1995·53 cites·14 claims
- 0880US4958345AMemory testing deviceADVANTEST CORP·Filed 1988·Granted Sep 18, 1990·39 cites·15 claims
- 0976US2025357569A1Heat absorber and secondary battery module including heat absorberDAINIPPON INK & CHEMICALS·Filed 2025·Application pending·0 cites
- 1074US5940875AAddress pattern generator for burst address access of an SDRAMADVANTEST CORP·Filed 1998·Granted Aug 17, 1999·31 cites·5 claims
- 1173US5481671AMemory testing device for multiported DRAMsADVANTEST CORP·Filed 1993·Granted Jan 2, 1996·35 cites·6 claims
- 1273US2024113386A1Secondary batteryDAINIPPON INK & CHEMICALS·Filed 2023·Application pending·0 cites
- 1371US4958346AMemory testing deviceADVANTEST CORP·Filed 1988·Granted Sep 18, 1990·27 cites·1 claims
- 1470US10968379B2Heat-storage compositionDAINIPPON INK & CHEMICALS·Filed 2018·Granted Apr 6, 2021·1 cites·12 claims
- 1570US2025084283A1Adhesive tape, article obtained using adhesive tape, and method for dismantling articlesDAINIPPON INK & CHEMICALS·Filed 2023·Application pending·0 cites
- 1664US8325547B2Test apparatus and repair analysis methodFUJISAKI KENICHI·Filed 2011·Granted Dec 4, 2012·3 cites·11 claims
- 1762US2025132413A1Secondary battery moduleDAINIPPON INK & CHEMICALS·Filed 2022·Application pending·0 cites
- 1860US6115833ASemiconductor memory testing apparatusADVANTEST CORP·Filed 1998·Granted Sep 5, 2000·19 cites·5 claims
- 1959US7529989B2Testing apparatus and testing methodADVANTEST CORP·Filed 2006·Granted May 5, 2009·4 cites·9 claims
- 2057US11340026B2Heat storage sheetDAINIPPON INK & CHEMICALS·Filed 2018·Granted May 24, 2022·0 cites·8 claims
- 2156US5835969AAddress test pattern generator for burst transfer operation of a SDRAMADVANTEST CORP·Filed 1995·Granted Nov 10, 1998·27 cites·2 claims
- 2255US2024402650A1Wearable device that reduces heat conduction from heat source to human bodyDAINIPPON INK & CHEMICALS·Filed 2022·Application pending·0 cites
- 2352US5734660AScan test circuit for use in semiconductor integrated circuitMOTOROLA INC·Filed 1996·Granted Mar 31, 1998·16 cites·2 claims
- 2449US8261139B2Clear instruction information to indicate whether memory test failure information is validFUJISAKI KENICHI·Filed 2010·Granted Sep 4, 2012·1 cites·8 claims
- 2549US5856985ATest pattern generatorADVANTEST CORP·Filed 1996·Granted Jan 5, 1999·12 cites·2 claims
- 2648US5852618AMultiple bit test pattern generatorADVANTEST CORP·Filed 1996·Granted Dec 22, 1998·11 cites·3 claims
- 2746US7636877B2Test apparatus having a pattern memory and test method for testing a device under testADVANTEST CORP·Filed 2007·Granted Dec 22, 2009·1 cites·10 claims
- 2843US2019107335A1Heat storage laminateDAINIPPON INK & CHEMICALS·Filed 2018·Application pending·0 cites
- 2942US6032281ATest pattern generator for memories having a block write functionADVANTEST CORP·Filed 1998·Granted Feb 29, 2000·8 cites·6 claims
- 3035US8677197B2Test apparatusFUJISAKI KENICHI·Filed 2011·Granted Mar 18, 2014·0 cites·15 claims
- 3132US2012117432A1Test apparatusFUJISAKI KENICHI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →