Inventor · disambiguated record
Kei Shimura
Also filed as: SHIMURA KEI
39 granted patents·9 pending applications·254 citations·filing 1991–2021
97Inventor score
Top patents by PatentIndex Score
48 records- 0190US8126259B2Method and apparatus for visual inspectionSHIMURA KEI·Filed 2010·Granted Feb 28, 2012·12 cites·2 claims
- 0289US9976966B2Defect inspection method and its deviceHITACHI HIGH TECH CORP·Filed 2016·Granted May 22, 2018·3 cites·4 claims
- 0387US11079275B2Far-infrared spectroscopy deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Aug 3, 2021·4 cites·10 claims
- 0485US5475210ANoise reduction system for optical record and reproduction apparatus using auto-power controlled semiconductor laser deviceTOSHIBA KK·Filed 1993·Granted Dec 12, 1995·39 cites·32 claims
- 0584US8921798B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 30, 2014·4 cites·7 claims
- 0683US8131058B2Method and apparatus for visual inspectionSHIMURA KEI·Filed 2006·Granted Mar 6, 2012·11 cites·2 claims
- 0782US10948347B2Far-infrared spectroscopy deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Mar 16, 2021·1 cites·2 claims
- 0881US9513228B2Defect inspection method and its deviceHITACHI HIGH TECH CORP·Filed 2012·Granted Dec 6, 2016·3 cites·20 claims
- 0979US8467048B2Pattern defect inspection apparatus and methodNISHIYAMA HIDETOSHI·Filed 2012·Granted Jun 18, 2013·2 cites·15 claims
- 1079US7746453B2Pattern defect inspection apparatus and methodHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 29, 2010·4 cites·14 claims
- 1177US11016023B1Far-infrared spectroscopic device and far-infrared spectroscopic methodHITACHI HIGH TECH CORP·Filed 2017·Granted May 25, 2021·2 cites·15 claims
- 1277US9164042B2Device for detecting foreign matter and method for detecting foreign matterAIKO KENJI·Filed 2012·Granted Oct 20, 2015·2 cites·21 claims
- 1376US7672799B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 2, 2010·11 cites·17 claims
- 1473US8879821B2Defect inspecting device and defect inspecting methodSHIMURA KEI·Filed 2010·Granted Nov 4, 2014·2 cites·18 claims
- 1572US8233145B2Pattern defect inspection apparatus and methodNISHIYAMA HIDETOSHI·Filed 2010·Granted Jul 31, 2012·1 cites·25 claims
- 1670US11644418B2Far-infrared light source and far-infrared spectrometerHITACHI HIGH TECH CORP·Filed 2021·Granted May 9, 2023·0 cites·15 claims
- 1770US11320309B2Far-infrared spectroscopy deviceHITACHI HIGH TECH CORP·Filed 2021·Granted May 3, 2022·0 cites·2 claims
- 1869US8472697B2Method and apparatus for visual inspectionSHIMURA KEI·Filed 2012·Granted Jun 25, 2013·2 cites·3 claims
- 1967US6577584B1Method and apparatus for detecting light from a multilayered objectUNIV ARIZONA·Filed 2000·Granted Jun 10, 2003·7 cites·19 claims
- 2066US10113959B2Terahertz wave generating device and spectroscopic device using sameHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 30, 2018·1 cites·18 claims
- 2163US9851548B2Optical microscope device and testing apparatus comprising sameSHIMURA KEI·Filed 2012·Granted Dec 26, 2017·2 cites·7 claims
- 2263US8351683B2Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 8, 2013·1 cites·13 claims
- 2362US9194795B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 24, 2015·0 cites·12 claims
- 2462US6421451B2Step difference detection apparatus and processing apparatus using the sameTOSHIBA KK·Filed 1998·Granted Jul 16, 2002·55 cites·24 claims
- 2562US5250796ANoise reduction system for optical record and reproduction apparatus using auto-power controlled semiconductor laser deviceTOSHIBA KK·Filed 1992·Granted Oct 5, 1993·13 cites·25 claims
- 2661US10613026B2Far-infrared imaging device and far-infrared imaging methodHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 7, 2020·0 cites·4 claims
- 2761US8194969B2Method and apparatus for visual inspectionSHIMURA KEI·Filed 2010·Granted Jun 5, 2012·2 cites·16 claims
- 2861US7953567B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·36 claims
- 2959US6095656ABacklighting apparatus and display apparatus using the sameTOSHIBA KK·Filed 1998·Granted Aug 1, 2000·26 cites·14 claims
- 3058US5216528AThree-dimensional multiplex hologramFUJI PHOTO OPTICAL CO LTD·Filed 1991·Granted Jun 1, 1993·19 cites·13 claims
- 3156US10203278B2Far-infrared imaging device and far-infrared imaging methodHITACHI HIGH TECH CORP·Filed 2015·Granted Feb 12, 2019·0 cites·7 claims
- 3256US2020371023A1Far-Infrared Light Source and Far-Infrared SpectrometerHITACHI HIGH TECH CORP·Filed 2017·Application pending·0 cites
- 3352US12196670B2Far-infrared spectroscopy deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jan 14, 2025·0 cites·10 claims
- 3452US9151719B2Inspection apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted Oct 6, 2015·0 cites·13 claims
- 3551US8611640B2Inspection apparatus and inspection methodHITACHI HIGH TECNOLOGIES CORP·Filed 2012·Granted Dec 17, 2013·0 cites·6 claims
- 3651US2011141272A1Apparatus and method for inspecting an object surface defectUTO SACHIO·Filed 2009·Application pending·0 cites
- 3751US2011019200A1Apparatus for visual inspectionHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 3850US11977026B2Far-infrared spectroscopy device and far-infrared spectroscopy methodHITACHI HIGH TECH CORP·Filed 2019·Granted May 7, 2024·0 cites·13 claims
- 3950US7706598B2Method and apparatus for visual inspectionHITACHI HIGH TECH CORP·Filed 2004·Granted Apr 27, 2010·5 cites·9 claims
- 4050US5949569AProjection display apparatus and spatial light modulation device applied to the sameTOSHIBA KK·Filed 1997·Granted Sep 7, 1999·18 cites·24 claims
- 4150US2025035547A1Far-Infrared Spectroscopic Device, and Far-Infrared Spectroscopic MethodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 4249US7821644B2Apparatus for visual inspectionHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 26, 2010·0 cites·9 claims
- 4348US2011221886A1Pattern defect inspecting apparatus and methodNISHIYAMA HIDETOSHI·Filed 2009·Application pending·0 cites
- 4444US2006072106A1Image viewing method for microstructures and defect inspection system using itMATSUI SHIGERU·Filed 2005·Application pending·0 cites
- 4540US2006078190A1Method and apparatus for inspecting defectsSHIBATA YUKIHIRO·Filed 2005·Application pending·0 cites
- 4639US8976347B2Inspection apparatusOKU MIZUKI·Filed 2012·Granted Mar 10, 2015·0 cites·8 claims
- 4739US2013088590A1Far infrared imaging device and imaging method using sameSHIMURA KEI·Filed 2011·Application pending·0 cites
- 4834US2013148113A1Inspection apparatus and inspection methodOKU MIZUKI·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Kei Shimura files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →